Advanced Synchrotron Radiation Techniques For Nanostructured Materials

Nanostructured materials exploit physical phenomena and mechanisms that cannot be derived by simply scaling down the associated bulk structures and phenomena; furthermore, new quantum effects come into play in nanosystems. The exploitation of these emerging nanoscale interactions prompts the innovative design of nanomaterials. Understanding the behavior of materials on all length scales—from the nanostructure up to the macroscopic response—is a critical challenge for materials science. Modern analytical technologies based on synchrotron radiation (SR) allow for the non-destructive investigation of the chemical, electronic, and magnetic structure of materials in any environment. SR facilities have developed revolutionary new ideas and experimental setups for characterizing nanomaterials, involving spectroscopy, diffraction, scatterings, microscopy, tomography, and all kinds of highly sophisticated combinations of such investigation techniques. This book is a collection of contributions addressing several aspects of synchrotron radiation as applied to the investigation of chemical, electronic, and magnetic structure of nanostructured materials. The results reported here provide not only an interesting and multidisciplinary overview of the chemicophysical investigations of nanostructured materials carried out by state-of-the-art SR-induced techniques, but also an exciting glance into the future perspectives of nanomaterial characterization methods.

Nanostructured materials exploit physical phenomena and mechanisms that cannot be derived by simply scaling down the associated bulk structures and phenomena; furthermore, new quantum effects come into play in nanosystems. The exploitation of these emerging nanoscale interactions prompts the innovative design of nanomaterials. Understanding the behavior of materials on all length scales-from the nanostructure up to the macroscopic response-is a critical challenge for materials science. Modern analytical technologies based on synchrotron radiation (SR) allow for the non-destructive investigation of the chemical, electronic, and magnetic structure of materials in any environment. SR facilities have developed revolutionary new ideas and experimental setups for characterizing nanomaterials, involving spectroscopy, diffraction, scatterings, microscopy, tomography, and all kinds of highly sophisticated combinations of such investigation techniques. This book is a collection of contributions addressing several aspects of synchrotron radiation as applied to the investigation of chemical, electronic, and magnetic structure of nanostructured materials. The results reported here provide not only an interesting and multidisciplinary overview of the chemicophysical investigations of nanostructured materials carried out by state-of-the-art SR-induced techniques, but also an exciting glance into the future perspectives of nanomaterial characterization methods.

Advanced Characterization of Nanostructured Materials — Probing the Structure and Dynamics with Synchrotron X-Rays and Neutrons is a collection of chapters which review the characterization of the structure and internal dynamics of a wide variety of nanostructured materials using various synchrotron X-ray and neutron scattering techniques. It is intended for graduate students and researchers who might be interested in learning about and applying these methods. The authors are well-known practitioners in their fields of research who provide detailed and authoritative accounts of how these techniques have been applied to study systems ranging from thin films and monolayers on solid surfaces and at liquid-air, liquid-liquid and solid-liquid interfaces; nanostructured composite materials; battery materials, and catalytic materials. While there have been a great many books published on nanoscience, there are relatively few that have discussed in one volume detailed synchrotron X-ray and neutron methods for advanced characterization of nanomaterials in thin films, composite materials, catalytic and battery materials and at interfaces. This book should provide an incentive and a reference for researchers in nanomaterials for using these techniques as a powerful way to characterize their samples. It should also help to popularize the use of synchrotron and neutron facilities by the nanoscience community.

Meeting the long-felt need for in-depth information on one of the most advanced material characterization methods, a top team of editors and authors from highly prestigious facilities and institutions covers a range of synchrotron techniques that have proven useful for materials research. Following an introduction to synchrotron radiation and its sources, the second part goes on to describe the various techniques that benefit from this especially bright light, including X-ray absorption, diffraction, scattering, imaging, and lithography. The thrid and final part provides an overview of the applications of synchrotron radiation in materials science. bridging the gap between specialists in synchrotron research and material scientists, this is a unique and indispensable resource for academic and industrial researchers alike.

Nowadays, nanomaterials are attracting huge attentions not only from a basic research point of view but also for their potential applications. Since finding the structure-property-processing relationships can open new windows in the application of materials, the material characterizations play a crucial role in the research and development of materials science. The increasing demand for energy with the necessity to find alternative renewable and sustainable energy sources leads to the rapid growth in attention to energy materials. In this book, the results of some outstanding researches on synchrotron-based characterization of nanostructured materials related to energy applications are presented.

Besides its coverage of the four important aspects of synchrotron sources, materials and material processes, measuring techniques, and applications, this ready reference presents both important method types: diffraction and tomography. Following an introduction, a general section leads on to methods, while further sections are devoted to emerging methods and industrial applications. In this way, the text provides new users of large-scale facilities with easy access to an understanding of both the methods and opportunities offered by different sources and instruments.

Much like earlier books in the series, this collection of papers, first published in 2001, brings together the materials science community and the characterization techniques that use synchrotron radiation. Surfaces, interfaces, electronic materials, thin films, carbides, polymers and alloys are all addressed. And while the editors did not anticipate that the cluster of papers treating cementitious materials would necessitate a separate section, it is interesting to see the application of cutting-edge techniques to Portland cement, a very complex materials system long used in engineering structures. Topics include: X-ray diffraction - structures and transformations; X-ray diffraction - stress, strain and texture; microtomography and microdiffraction; SR methods applied to cementitious materials; magnetic materials; X-ray absorption and photoemission; and X-ray scattering and interfaces.

Fifth volume of a 40 volume series on nanoscience and nanotechnology, edited by the renowned scientist Challa S.S.R. Kumar. This handbook gives a comprehensive overview about X-ray and Neutron Techniques for Nanomaterials Characterization. Modern applications and state-of-the-art techniques are covered and make this volume an essential reading for research scientists in academia and industry.