High Resolution X Ray Spectroscopy

NASA's Chandra X-ray Observatory and ESA's XMM-Newton Observatory have been the pioneering satellites for studying the Universe with X-rays and the cornerstone of X-ray spectroscopy since their launches more than 20 years ago. The onboard gratings provide us a unique opportunity to distinguish individual spectral lines from different atoms thanks to their high energy resolutions. Enormous discoveries have been achieved by these two missions when observing a variety of X-ray-emitting astronomical objects, such as black holes, supernova remnants, clusters of galaxies, and stars. However, the data are limited to fairly bright X-ray sources. The recent JAXA's mission Hitomi opened a new window of high-resolution X-ray spectroscopy thanks to its onboard X-ray calorimeter. Although this mission was shortly terminated due to a mishap, Hitomi left behind a few sets of observations awaiting more data mining. The first half of this book introduces the history of high-resolution X-ray spectroscopy and different generations of X-ray spectrometers. A tutorial guide on how to reduce, analyze, and understand the astronomical data from Chandra, XMM-Newton, and Hitomi is also included. The second half of the book reviews past results obtained by the high-resolution spectrometers on these missions on multiple topics and discusses possible discoveries by upcoming missions in the next decade.

High-resolution X-ray spectroscopy has become a powerful tool for astrophysics since the launch of Chandra and XMM-Newton, ten years ago. The grating spectrometers on both instruments still continue to provide excellent data, while imaging calorimeters are being prepared for future missions like Astro-H and IXO. The synergy with other wavelength bands like the UV has been boosted by the addition of COS to HST. X-ray spectroscopy offers unique diagnostics to study almost any object in the Universe. This book contains review papers on highlights and the state-of-the-art of X-ray spectroscopy for a broad range of objects and on the prospects for future studies.

The x-ray is the only invention that became a regular diagnostic tool in hospitals within a week of its first observation by Roentgen in 1895. Even today, x-rays are a great characterization tool at the hands of scientists working in almost every field, such as medicine, physics, material science, space science, chemistry, archeology, and metallurgy. With vast existing applications of x-rays, it is even more surprising that every day people are finding new applications of x-rays or refining the existing techniques. This book consists of selected chapters on the recent applications of x-ray spectroscopy that are of great interest to the scientists and engineers working in the fields of material science, physics, chemistry, astrophysics, astrochemistry, instrumentation, and techniques of x-ray based characterization. The chapters have been grouped into two major sections based upon the techniques and applications. The book covers some basic principles of satellite x-rays as characterization tools for chemical properties and the physics of detectors and x-ray spectrometer. The techniques like EDXRF, WDXRF, EPMA, satellites, micro-beam analysis, particle induced XRF, and matrix effects are discussed. The characterization of thin films and ceramic materials using x-rays is also covered.

This book gives an account of the proceedings of the International Astronomical Union Colloquium 115: High Resolution X-Ray Spectroscopy of Cosmic Plasmas. This was the first IAU meeting dedicated to high resolution X-ray spectroscopy of objects outside the solar system. A broad range of objects and astrophysical conditions are discussed. Results from the first generation of satellites with spectroscopic capability, i.e. the Einstein Observatory, EXOSAT, and Tenma, are reviewed from a perspective of a more precise interpretation allowed by improved theoretical models and plasma diagnostics. Laboratory and solar X-ray results that model or are relevant to conditions found in cosmic X-ray sources are also presented. The colloquium presents a forum for discussion of scientific objectives of new international missions in high resolution X-ray spectroscopy.

X-ray scattering techniques are a family of nondestructive analytical techniques. Using these techniques, scientists obtain information about the crystal structure and chemical and physical properties of materials. Nowadays, different techniques are based on observing the scattered intensity of an X-ray beam hitting a sample as a function of incident and scattered angle, polarization, and wavelength. This book is intended to give overviews of the relevant X-ray scattering techniques, particularly about inelastic X-ray scattering, elastic scattering, grazing-incidence small-angle X-ray scattering, small-angle X-ray scattering, and high-resolution X-ray diffraction, and, finally, applications of X-ray spectroscopy to study different biological systems.

An up-to-date overview of the different x-ray based methods in the hot fields of nanoscience and nanotechnology, including methods for imaging nanomaterials, as well as for probing the electronic structure of nanostructured materials in order to investigate their different properties. Written by authors at one of the world's top facilities working with these methods, this monograph presents and discusses techniques and applications in the fields of x-ray scattering, spectroscopy and microscope imaging. The resulting systematic collection of these advanced tools will benefit graduate students, postdocs as well as professional researchers.

X-Ray Spectrometry: Recent Technological Advances covers the latest developments and areas of research in the methodological and instrumental aspects of x-ray spectrometry. Includes the most advanced and high-tech aspects of the chemical analysis techniques based on x-rays Introduces new types of X-ray optics and X-ray detectors, covering history, principles, characteristics and future trends Written by internationally recognized scientists, all of whom are eminent specialists in each of the sub-fields Sections include: X-Ray Sources, X-Ray Optics, X-Ray Detectors, Special Configurations, New Computerization Methods, New Applications This valuable book will assist all analytical chemists and other users of x-ray spectrometry to fully exploit the capabilities of this set of powerful analytical tools and to further expand applications in such fields as material and environmental sciences, medicine, toxicology, forensics, archaeometry and many others.

This work covers important aspects of X-ray spectrometry, from basic principles to the selection of instrument parameters and sample preparation. This edition explicates the use of combined X-ray fluorescence and X-ray diffraction data, and features new applications in environmental studies, forensic science, archeometry and the analysis of metals and alloys, minerals and ore, ceramic materials, catalysts and trace metals.;This work is intended for spectroscopists, analytical chemists, materials scientists, experimental physicists, mineralogists, biologists, geologists and graduate-level students in these disciplines.