International Tables For X Ray Crystallography Revised And Supplementary Tables To Volumes 2 3
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International Tables for X ray Crystallography Revised and supplementary tables to volumes II and III
Author | : International Union of Crystallography |
Publsiher | : Unknown |
Total Pages | : 388 |
Release | : 1974 |
Genre | : Crystallography |
ISBN | : UVA:X002024952 |
Download International Tables for X ray Crystallography Revised and supplementary tables to volumes II and III Book in PDF, Epub and Kindle
International Tables for X ray Crystallography
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Author | : Anonim |
Publsiher | : Unknown |
Total Pages | : 135 |
Release | : 1974 |
Genre | : Electronic Book |
ISBN | : OCLC:928812897 |
Download International Tables for X ray Crystallography Book in PDF, Epub and Kindle
International Tables for X ray Crystallography Revised and supplementary tables to volumes 2 3
Author | : International Union of Crystallography |
Publsiher | : Unknown |
Total Pages | : 406 |
Release | : 1974 |
Genre | : Crystallography |
ISBN | : STANFORD:36105002851785 |
Download International Tables for X ray Crystallography Revised and supplementary tables to volumes 2 3 Book in PDF, Epub and Kindle
International Tables for Crystallography Volume C
Author | : E. Prince |
Publsiher | : Springer Science & Business Media |
Total Pages | : 1033 |
Release | : 2004-01-31 |
Genre | : Science |
ISBN | : 9781402019005 |
Download International Tables for Crystallography Volume C Book in PDF, Epub and Kindle
International Tables for Crystallography are no longer available for purchase from Springer. For further information please contact Wiley Inc. (follow the link on the right hand side of this page). The purpose of Volume C is to provide the mathematical, physical and chemical information needed for experimental studies in structural crystallography. The volume covers all aspects of experimental techniques, using all three principal radiation types, from the selection and mounting of crystals and production of radiation, through data collection and analysis, to interpretation of results. As such, it is an essential source of information for all workers using crystallographic techniques in physics, chemistry, metallurgy, earth sciences and molecular biology.
Fundamentals of Crystals
Author | : Boris K. Vainshtein |
Publsiher | : Springer Science & Business Media |
Total Pages | : 520 |
Release | : 1994 |
Genre | : Juvenile Nonfiction |
ISBN | : 3540565582 |
Download Fundamentals of Crystals Book in PDF, Epub and Kindle
From the reviews: "[...] an excellent reference book. I have no doubt it will become a much-thumbed resource for students and researchers in mineralogy and crystallography." Geological Magazine
International Tables for Crystallography Volume B
Author | : Uri Shmueli |
Publsiher | : Springer Science & Business Media |
Total Pages | : 704 |
Release | : 2008-08-27 |
Genre | : Science |
ISBN | : 1402082053 |
Download International Tables for Crystallography Volume B Book in PDF, Epub and Kindle
International Tables for Crystallography are no longer available for purchase from Springer. For further information please contact Wiley Inc. (follow the link on the right hand side of this page). Volume B presents accounts of the numerous aspects of reciprocal space in crystallographic research. After an introductory chapter, Part 1 presents the reader with an account of structure-factor formalisms, an extensive treatment of the theory, algorithms and crystallographic applications of Fourier methods, and fundamental as well as advanced treatments of symmetry in reciprocal space. In Part 2, these general accounts are followed by detailed expositions of crystallographic statistics, the theory of direct methods, Patterson techniques, isomorphous replacement and anomalous scattering, and treatments of the role of electron microscopy and diffraction in crystal structure determination, including applications of direct methods to electron crystallography. Part 3 deals with applications of reciprocal space to molecular geometry and `best'-plane calculations, and contains a treatment of the principles of molecular graphics and modelling and their applications. A convergence-acceleration method of importance in the computation of approximate lattice sums is presented and the part concludes with a discussion of the Ewald method. Part 4 contains treatments of various diffuse-scattering phenomena arising from crystal dynamics, disorder and low dimensionality (liquid crystals), and an exposition of the underlying theories and/or experimental evidence. Polymer crystallography and reciprocal-space images of aperiodic crystals are also treated. Part 5 of the volume contains introductory treatments of the theory of the interaction of radiation with matter (dynamical theory) as applied to X-ray, electron and neutron diffraction techniques. The simplified trigonometric expressions for the structure factors in the 230 three-dimensional space groups, which appeared in Volume I of International Tables for X-ray Crystallography, are now given in Appendix 1.4.3 to Chapter 1.4 of this volume. Volume B is a vital addition to the library of scientists engaged in crystal structure determination, crystallographic computing, crystal physics and other fields of crystallographic research. Graduate students specializing in crystallography will find much material suitable for self-study and a rich source of references to the relevant literature.
Suggestions to Authors of the Reports of the United States Geological Survey
Author | : Wallace R. Hansen |
Publsiher | : Interior Department |
Total Pages | : 316 |
Release | : 1991 |
Genre | : Geology |
ISBN | : MINN:31951P00092273G |
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X Ray and Neutron Reflectivity Principles and Applications
Author | : Jean Daillant,Alain Gibaud |
Publsiher | : Springer Science & Business Media |
Total Pages | : 331 |
Release | : 2003-07-01 |
Genre | : Science |
ISBN | : 9783540486961 |
Download X Ray and Neutron Reflectivity Principles and Applications Book in PDF, Epub and Kindle
The reflection of and neutrons from surfaces has existed as an x-rays exp- imental for almost it is in the last technique fifty Nevertheless, only years. decade that these methods have become as of enormously popular probes This the surfaces and interfaces. to be due to of several appears convergence of intense different circumstances. These include the more n- availability be measured orders tron and sources that can over (so reflectivity x-ray many of and the much weaker surface diffuse can now also be magnitude scattering of thin films and studied in some the detail); growing importance multil- basic the realization of the ers in both and technology research; important which in the of surfaces and and role roughness plays properties interfaces; the of statistical models to characterize the of finally development topology its and its characterization from on roughness, dependence growth processes The of and to surface scattering experiments. ability x-rays neutro4s study four five orders of in scale of surfaces over to magnitude length regardless their and also their to ability probe environment, temperature, pressure, etc. , makes these the choice for buried interfaces often probes preferred obtaining information about the microstructure of often in statistical a global surfaces, the local This is manner to complementary imaging microscopy techniques, of such studies in the literature witnessed the veritable by explosion published the last few Thus these lectures will useful for over a resource years.