Metrology And Diagnostic Techniques For Nanoelectronics
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Metrology and Diagnostic Techniques for Nanoelectronics
Author | : Zhiyong Ma,David G. Seiler |
Publsiher | : CRC Press |
Total Pages | : 1454 |
Release | : 2017-03-27 |
Genre | : Science |
ISBN | : 9781351733953 |
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Nanoelectronics is changing the way the world communicates, and is transforming our daily lives. Continuing Moore’s law and miniaturization of low-power semiconductor chips with ever-increasing functionality have been relentlessly driving R&D of new devices, materials, and process capabilities to meet performance, power, and cost requirements. This book covers up-to-date advances in research and industry practices in nanometrology, critical for continuing technology scaling and product innovation. It holistically approaches the subject matter and addresses emerging and important topics in semiconductor R&D and manufacturing. It is a complete guide for metrology and diagnostic techniques essential for process technology, electronics packaging, and product development and debugging—a unique approach compared to other books. The authors are from academia, government labs, and industry and have vast experience and expertise in the topics presented. The book is intended for all those involved in IC manufacturing and nanoelectronics and for those studying nanoelectronics process and assembly technologies or working in device testing, characterization, and diagnostic techniques.
Metrology and Diagnostic Techniques for Nanoelectronics
Author | : Zhiyong Ma,David G. Seiler |
Publsiher | : CRC Press |
Total Pages | : 843 |
Release | : 2017-03-27 |
Genre | : Science |
ISBN | : 9781351733946 |
Download Metrology and Diagnostic Techniques for Nanoelectronics Book in PDF, Epub and Kindle
Nanoelectronics is changing the way the world communicates, and is transforming our daily lives. Continuing Moore’s law and miniaturization of low-power semiconductor chips with ever-increasing functionality have been relentlessly driving R&D of new devices, materials, and process capabilities to meet performance, power, and cost requirements. This book covers up-to-date advances in research and industry practices in nanometrology, critical for continuing technology scaling and product innovation. It holistically approaches the subject matter and addresses emerging and important topics in semiconductor R&D and manufacturing. It is a complete guide for metrology and diagnostic techniques essential for process technology, electronics packaging, and product development and debugging—a unique approach compared to other books. The authors are from academia, government labs, and industry and have vast experience and expertise in the topics presented. The book is intended for all those involved in IC manufacturing and nanoelectronics and for those studying nanoelectronics process and assembly technologies or working in device testing, characterization, and diagnostic techniques.
Nanotechnology and Nanoelectronics
Author | : Wolfgang Fahrner |
Publsiher | : Springer Science & Business Media |
Total Pages | : 269 |
Release | : 2005-12-05 |
Genre | : Technology & Engineering |
ISBN | : 9783540266211 |
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Split a human hair thirty thousand times, and you have the equivalent of a nanometer. The aim of this work is to provide an introduction into nanotechnology for the s- entifically interested. However, such an enterprise requires a balance between comprehensibility and scientific accuracy. In case of doubt, preference is given to the latter. Much more than in microtechnology – whose fundamentals we assume to be known – a certain range of engineering and natural sciences are interwoven in nanotechnology. For instance, newly developed tools from mechanical engine- ing are essential in the production of nanoelectronic structures. Vice versa, - chanical shifts in the nanometer range demand piezoelectric-operated actuators. Therefore, special attention is given to a comprehensive presentation of the matter. In our time, it is no longer sufficient to simply explain how an electronic device operates; the materials and procedures used for its production and the measuring instruments used for its characterization are equally important. The main chapters as well as several important sections in this book end in an evaluation of future prospects. Unfortunately, this way of separating coherent - scription from reflection and speculation could not be strictly maintained. So- times, the complete description of a device calls for discussion of its inherent - tential; the hasty reader in search of the general perspective is therefore advised to study this work’s technical chapters as well.
Nanotechnology And Nanoelectronics Materials Devices Measurement Techniques
Author | : Fahrner |
Publsiher | : Unknown |
Total Pages | : 269 |
Release | : 2006-07-01 |
Genre | : Electronic Book |
ISBN | : 8181284828 |
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Measurement Techniques for Radio Frequency Nanoelectronics
Author | : T. Mitch Wallis,Pavel Kabos |
Publsiher | : Cambridge University Press |
Total Pages | : 329 |
Release | : 2017-09-14 |
Genre | : Science |
ISBN | : 9781107120686 |
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Featuring numerous examples linking theoretical concepts with real-world applications, this practical, cross-disciplinary guide will help you understand the fundamentals of radio frequency measurement of nanoscale devices. -- Résumé abrégé du livre.
Metrology and Standardization for Nanotechnology
Author | : Elisabeth Mansfield,Debra L. Kaiser,Daisuke Fujita,Marcel Van de Voorde |
Publsiher | : John Wiley & Sons |
Total Pages | : 626 |
Release | : 2017-04-10 |
Genre | : Technology & Engineering |
ISBN | : 9783527340392 |
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For the promotion of global trading and the reduction of potential risks, the role of international standardization of nanotechnologies has become more and more important. This book gives an overview of the current status of nanotechnology including the importance of metrology and characterization at the nanoscale, international standardization of nanotechnology, and industrial innovation of nano-enabled products. First the field of nanometrology, nanomaterial standardization and nanomaterial innovation is introduced. Second, major concepts in analytical measurements are given in order to provide a basis for the reliable and reproducible characterization of nanomaterials. The role of standards organizations are presented and finally, an overview of risk management and the commercial impact of metrology and standardization for industrial innovations.
Electrical Atomic Force Microscopy for Nanoelectronics
Author | : Umberto Celano |
Publsiher | : Springer |
Total Pages | : 408 |
Release | : 2019-08-01 |
Genre | : Science |
ISBN | : 9783030156121 |
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The tremendous impact of electronic devices on our lives is the result of continuous improvements of the billions of nanoelectronic components inside integrated circuits (ICs). However, ultra-scaled semiconductor devices require nanometer control of the many parameters essential for their fabrication. Through the years, this created a strong alliance between microscopy techniques and IC manufacturing. This book reviews the latest progress in IC devices, with emphasis on the impact of electrical atomic force microscopy (AFM) techniques for their development. The operation principles of many techniques are introduced, and the associated metrology challenges described. Blending the expertise of industrial specialists and academic researchers, the chapters are dedicated to various AFM methods and their impact on the development of emerging nanoelectronic devices. The goal is to introduce the major electrical AFM methods, following the journey that has seen our lives changed by the advent of ubiquitous nanoelectronics devices, and has extended our capability to sense matter on a scale previously inaccessible.
Analytical and Diagnostic Techniques for Semiconductor Materials Devices and Processes 7
Author | : Dieter K. Schroder |
Publsiher | : The Electrochemical Society |
Total Pages | : 406 |
Release | : 2007 |
Genre | : Semiconductors |
ISBN | : 9781566775694 |
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Diagnostic characterization techniques for semiconductor materials, devices and device processing are addressed at this symposium. It will cover new techniques as well as advances in routine analytical technology applied to semiconductor process development and manufacture. The hardcover edition includes a CD-ROM of ECS Transactions, Volume 10, Issue 1, Analytical Techniques for Semiconductor Materials and Process Characterization 5 (ALTECH 2007). The PDF edition also includes the ALTECH 2007 papers.