Minimum Number Of Timing Signoff Corners

This unique book outlines a brand-new approach of how to do timing signoff of complex microchips with the minimum number of corners. It is the first book in my planned series of books on global and local on-chip variations (OCV) and statistical, Monte-Carlo-based methods of timing signoff. I have spent more than 7 years on developing those new methods and now will share my results with the electronic design community. Each book will have a short version as a E-book that will be followed by a paperback/cover full version book with all important details. The books are mainly targeting microchip designers and software engineers in Electronic Design Automation (EDA) companies as well as companies that design and/or manufacture microchips. The number of timing signoff corners exponentially grows and makes microchip design very complex, time consuming, or even impossible to close timing. Additionally, there is a toll on microchip performance due to conservatism, which increases with the corner number. All delay, dimension, and other absolute values are scaled (or normalized) and do not represent real values/parameters of any particular technology node or design. Initially, I focus on factors impacting the corner number and how to find the minimum number of traditional Power, Voltage, Temperature (PVT), and Resistance, Capacitance (RC) corners. Then, I outline a break-through method with the absolute minimum of the corner number where instead of PVT/RC corners I introduce 4 min/max timing delay corners (so-called slack corners). Then, I discuss a new approach on how to design for the maximum profit by setting a proper target for the timing yield Y during timing signoff. Finally, I discuss possible enhancements in signoff paradigms, methods, and statistical STA tools. The importance of these pseudo- and fully statistical Monte Carlo-based post-STA methods is to study OCV variations in detail and justify all OCV derates for STA tools no matter whether the PVT/RC corners signoff is or the 4-slack corners is used.

This unique book outlines a brand new approach how to timing the signoff of complex microchips with the minimum number of corners. It is the first book in my planned series of books on global and local on-chip variations (OCV) and statistical, Monte-Carlo-based methods of timing signoff. I have spent more than 7 years developing those new methods and now will share my results with the electronic design community. Each book will have a short version as a Kindle e-book that will be followed by a paperback/cover full version book with all important details. The books are mainly targeting microchip designers and software engineers in Electronic Design Automation (EDA) companies as well as companies that design and/or manufacture microchips. The number of timing signoff corners exponentially grows and makes microchip design very complex, time-consuming, or even impossible to close timing. Additionally, there is a toll on microchip performance due to conservatism, which increases with the corner number. All delay, dimension, and other absolute values are scaled (or normalized) and do not represent real values/parameters of any particular technology node or design. Initially, I focus on factors impacting the corner number and how to find the minimum number of traditional Power, Voltage, Temperature (PVT), and Resistance, Capacitance (RC) corners. Then, I describe a break-through method with the absolute minimum of the corner number where instead of PVT/RC corners I introduce 4 min/max timing delay corners (so-called slack corners). Then, I discuss a new approach on how to design for the maximum profit by setting a proper target for the timing yield Y during timing signoff. Finally, I discuss possible enhancements in signoff paradigms, methods, and statistical STA tools. The importance of these pseudo- and fully statistical Monte Carlo-based post-STA methods is to study OCV variations in detail and justify all OCV derates for STA tools no matter whether the PVT/RC corners signoff is or the 4-slack corners is used.

Emerging Technologies and Circuits contains a set of outstanding papers, keynote and tutorials presented during 3 days at the International Conference On Integrated Circuit Design and Technology (ICICDT) held in June 2008 in Minatec, Grenoble.

The Art of Timing Closure is written using a hands-on approach to describe advanced concepts and techniques using Multi-Mode Multi-Corner (MMMC) for an advanced ASIC design implementation. It focuses on the physical design, Static Timing Analysis (STA), formal and physical verification. The scripts in this book are based on Cadence® Encounter SystemTM. However, if the reader uses a different EDA tool, that tool’s commands are similar to those shown in this book. The topics covered are as follows: Data Structures Multi-Mode Multi-Corner Analysis Design Constraints Floorplan and Timing Placement and Timing Clock Tree Synthesis Final Route and Timing Design Signoff Rather than go into great technical depth, the author emphasizes short, clear descriptions which are implemented by references to authoritative manuscripts. It is the goal of this book to capture the essence of physical design and timing analysis at each stage of the physical design, and to show the reader that physical design and timing analysis engineering should be viewed as a single area of expertise. This book is intended for anyone who is involved in ASIC design implementation -- starting from physical design to final design signoff. Target audiences for this book are practicing ASIC design implementation engineers and students undertaking advanced courses in ASIC design.

iming, timing, timing! That is the main concern of a digital designer charged with designing a semiconductor chip. What is it, how is it T described, and how does one verify it? The design team of a large digital design may spend months architecting and iterating the design to achieve the required timing target. Besides functional verification, the t- ing closure is the major milestone which dictates when a chip can be - leased to the semiconductor foundry for fabrication. This book addresses the timing verification using static timing analysis for nanometer designs. The book has originated from many years of our working in the area of timing verification for complex nanometer designs. We have come across many design engineers trying to learn the background and various aspects of static timing analysis. Unfortunately, there is no book currently ava- able that can be used by a working engineer to get acquainted with the - tails of static timing analysis. The chip designers lack a central reference for information on timing, that covers the basics to the advanced timing veri- cation procedures and techniques.

This book provides an invaluable primer on the techniques utilized in the design of low power digital semiconductor devices. Readers will benefit from the hands-on approach which starts form the ground-up, explaining with basic examples what power is, how it is measured and how it impacts on the design process of application-specific integrated circuits (ASICs). The authors use both the Unified Power Format (UPF) and Common Power Format (CPF) to describe in detail the power intent for an ASIC and then guide readers through a variety of architectural and implementation techniques that will help meet the power intent. From analyzing system power consumption, to techniques that can be employed in a low power design, to a detailed description of two alternate standards for capturing the power directives at various phases of the design, this book is filled with information that will give ASIC designers a competitive edge in low-power design.

This book discusses the advantages and challenges of Body-Biasing for integrated circuits and systems, together with the deployment of the design infrastructure needed to generate this Body-Bias voltage. These new design solutions enable state of the art energy efficiency and system flexibility for the latest applications, such as Internet of Things and 5G communications.