On Chip Instrumentation

This book provides an in-depth overview of on chip instrumentation technologies and various approaches taken in adding instrumentation to System on Chip (ASIC, ASSP, FPGA, etc.) design that are collectively becoming known as Design for Debug (DfD). On chip instruments are hardware based blocks that are added to a design for the specific purpose and improving the visibility of internal or embedded portions of the design (specific instruction flow in a processor, bus transaction in an on chip bus as examples) to improve the analysis or optimization capabilities for a SoC. DfD is the methodology and infrastructure that surrounds the instrumentation. Coverage includes specific design examples and discussion of implementations and DfD tradeoffs in a decision to design or select instrumentation or SoC that include instrumentation. Although the focus will be on hardware implementations, software and tools will be discussed in some detail.

This valuable resource covers the principles of analytical instrumentation used by today's chemists and biologists and presents important advances in instrumentation, such as the drive to miniaturise and lab-on-a-chip devices. In terms of the lab-based analytical instrumentation, the five main categories of technique—spectroscopic, chromatographic, electrochemical, imaging and thermoanalytical, are included and presented in a practical, not theoretical way. Including relevant examples and applications in a number of fields such as healthcare, environment and pharmaceutical industry this book provides a complete overview of the instruments used within the chemistry industry, making this an important tool for professionals and students alike.

This book is written in a simple and easy-to-understand language to explain the fundamental concepts of the subject. The book presents the subject of EIPC in a comprehensive manner to the students at undergraduate level.This book not only covers the entire scope of the subject but also explains the philosophy of the subject. This makes the understanding of the subject more clear and interesting. The book will be very useful not only to the students but also to the faculty members.

This book provides the fundamental concepts of system design using microprocessors in the field of agriculture instrumentation. It begins with an introduction to the field of agriculture and application of instrumentation in agriculture, and the book then covers the transducers specific to the agricultural field. The binary number system and arithmetic are covered as the basic building block of digital circuits and computer organization. The microprocessor basics and Intel 8085 hardware and software have been discussed in detail. The book describes microprocessor peripheral inter-facing and its support chips such as Intel 8225, Intel 8253 and Intel 8279 along with their applications. It discusses analog to digital and digital to analog interface, CRT terminal interface and printer interface. In addition, the book includes case studies on various microprocessor applications in agriculture, such as microprocessor-based system design for grain moisture, safe grain storage, soil nutrient estimation and drip irrigation. Finally, the book ends with an advanced and futuristic topic on precision agriculture to give an exposure to students about future developments in the agricultural system. Key Features : • From concepts to design, the book follows a step-by-step approach. • Gives a large number of figures for easy understanding of theory. • Includes a good number of examples and end-of-chapter exercises both in the hardware and software sections. • Presents a number of case studies on the design of microprocessor-based agri-instrumentation systems. • Offers exercises on the case studies which can be used for further development of the concepts. The book is primarily intended for the undergraduate and postgraduate students of agricultural engineering for their courses on agri instrumen-tation and microprocessor applications in agriculture.

This volume contains selected papers which had been presented during CISCON 2018. The papers cover the latest trends in the fields of instrumentation, sensors and systems, industrial automation & control, image and signal processing, robotics, renewable energy, power systems and power drives, with focus on solving the current challenges faced in the field of instrumentation and control engineering. This volume will be of use to academic and industry researchers and students working in this field.

Power supply current monitoring to detect CMOS IC defects during production testing quietly laid down its roots in the mid-1970s. Both Sandia Labs and RCA in the United States and Philips Labs in the Netherlands practiced this procedure on their CMOS ICs. At that time, this practice stemmed simply from an intuitive sense that CMOS ICs showing abnormal quiescent power supply current (IDDQ) contained defects. Later, this intuition was supported by data and analysis in the 1980s by Levi (RACD, Malaiya and Su (SUNY-Binghamton), Soden and Hawkins (Sandia Labs and the University of New Mexico), Jacomino and co-workers (Laboratoire d'Automatique de Grenoble), and Maly and co-workers (Carnegie Mellon University). Interest in IDDQ testing has advanced beyond the data reported in the 1980s and is now focused on applications and evaluations involving larger volumes of ICs that improve quality beyond what can be achieved by previous conventional means. In the conventional style of testing one attempts to propagate the logic states of the suspended nodes to primary outputs. This is done for all or most nodes of the circuit. For sequential circuits, in particular, the complexity of finding suitable tests is very high. In comparison, the IDDQ test does not observe the logic states, but measures the integrated current that leaks through all gates. In other words, it is like measuring a patient's temperature to determine the state of health. Despite perceived advantages, during the years that followed its initial announcements, skepticism about the practicality of IDDQ testing prevailed. The idea, however, provided a great opportunity to researchers. New results on test generation, fault simulation, design for testability, built-in self-test, and diagnosis for this style of testing have since been reported. After a decade of research, we are definitely closer to practice.