Optical Constants Of Crystalline And Amorphous Semiconductors

Knowledge of the refractive indices and absorption coefficients of semiconductors is especially import in the design and analysis of optical and optoelectronic devices. The determination of the optical constants of semiconductors at energies beyond the fundamental absorption edge is also known to be a powerful way of studying the electronic energy-band structures of the semiconductors. The purpose of this book is to give tabulated values and graphical information on the optical constants of the most popular semiconductors over the entire spectral range. This book presents data on the optical constants of crystalline and amorphous semiconductors. A complete set of the optical constants are presented in this book. They are: the complex dielectric constant (E=e.+ieJ, complex refractive index (n*=n+ik), absorption coefficient (a.), and normal-incidence reflectivity (R). The semiconductor materials considered in this book are the group-IV elemental and binary, llI-V, IT-VI, IV-VI binary semiconductors, and their alloys. The reader will fmd the companion book "Optical Properties of Crystalline and Amorphous Semiconductors: Materials and Fundamental Principles" useful since it emphasizes the basic material properties and fundamental prinCiples.

Optical Properties of Crystalline and Amorphous Semiconductors: Materials and Fundamental Principles presents an introduction to the fundamental optical properties of semiconductors. This book presents tutorial articles in the categories of materials and fundamental principles (Chapter 1), optical properties in the reststrahlen region (Chapter 2), those in the interband transition region (Chapters 3 and 4) and at or below the fundamental absorption edge (Chapter 5). Optical Properties of Crystalline and Amorphous Semiconductors: Materials and Fundamental Principles is presented in a form which could serve to teach the underlying concepts of semiconductor optical properties and their implementation. This book is an invaluable resource for device engineers, solid-state physicists, material scientists and students specializing in the fields of semiconductor physics and device engineering.

Semiconductors with optical characteristics have found widespread use in evolving semiconductor photovoltaics, where optical features are important. The industrialization of semiconductors and their allied applications have paved the way for optical measurement techniques to be used in new ways. Due to their unique properties, semiconductors are key components in the daily employed technologies in healthcare, computing, communications, green energy, and a range of other uses. This book examines the fundamental optical properties and applications of semiconductors. It summarizes the information as well as the optical characteristics and applicability of semiconductors through an in-depth review of the literature. Accomplished experts in the field share their knowledge and examine new developments. FEATURES Comprehensive coverage of all types of optical applications using semiconductors Explores relevant composite materials and devices for each application Addresses the optical properties of crystalline and amorphous semiconductors Describes new developments in the field and future potential applications Optical Properties and Applications of Semiconductors is a comprehensive reference and an invaluable resource for engineers, scientists, academics, and industry R&D teams working in applied physics.

Amorphous semiconductors are subtances in the amorphous solid state that have the properties of a semiconductor and which are either covalent or tetrahedrally bonded amorphous semiconductors or chelcogenide glasses. Developed from both a theoretical and experimental viewpoint Deals with, amongst others, preparation techniques, structural, optical and electronic properties, and light induced phenomena Explores different types of amorphous semiconductors including amorphous silicon, amorphous semiconducting oxides and chalcogenide glasses Applications include solar cells, thin film transistors, sensors, optical memory devices and flat screen devices including televisions

This book is an account of the manner in which the optical phenomena observed from solids relate to their fundamental properties. Written at the graduate level, it attempts a threefold purpose: an indication of the breadth of the subject, an in-depth examination of important areas, and a text for a two-semester course. The first two chapters present introductory theory as a foundation for subsequent reading. The following ten chapters broadly concern electronic properties associated with semiconductors ranging from narrow to wide energy gap materials. Lattice properties are examined in the remaining chap ters, in which effects governed by phonons in perfect crystals, point defects, their vibrational and electronic spectra, and electron-phonon interactions are stressed. Fun and hard work, both in considerable measure, have gone into the preparation of this volume. At the University of Freiburg, W. Germany, from August 7-20, 1966, the occasion of a NATO Advanced Study Institute on "The Optical Properties of Solids," the authors of these various chapters lectured for the Institute; this volume provides essentially the "Proceed ings" of that meeting. Many major revisions of original lectures (contrac tions and enlargements) were required for better organization and presentation of the subject matter. Several abbreviated chapters appear mainly to indicate the importance of their contents in optical properties research and to indicate recently published books that provide ample coverage. We are indebted to many people: the authors for their efforts and patience; our host at the University of Freiburg, the late Professor Dr.

Provides a semi-quantitative approach to recent developments in the study of optical properties of condensed matter systems Featuring contributions by noted experts in the field of electronic and optoelectronic materials and photonics, this book looks at the optical properties of materials as well as their physical processes and various classes. Taking a semi-quantitative approach to the subject, it presents a summary of the basic concepts, reviews recent developments in the study of optical properties of materials and offers many examples and applications. Optical Properties of Materials and Their Applications, 2nd Edition starts by identifying the processes that should be described in detail and follows with the relevant classes of materials. In addition to featuring four new chapters on optoelectronic properties of organic semiconductors, recent advances in electroluminescence, perovskites, and ellipsometry, the book covers: optical properties of disordered condensed matter and glasses; concept of excitons; photoluminescence, photoinduced changes, and electroluminescence in noncrystalline semiconductors; and photoinduced bond breaking and volume change in chalcogenide glasses. Also included are chapters on: nonlinear optical properties of photonic glasses; kinetics of the persistent photoconductivity in crystalline III-V semiconductors; and transparent white OLEDs. In addition, readers will learn about excitonic processes in quantum wells; optoelectronic properties and applications of quantum dots; and more. Covers all of the fundamentals and applications of optical properties of materials Includes theory, experimental techniques, and current and developing applications Includes four new chapters on optoelectronic properties of organic semiconductors, recent advances in electroluminescence, perovskites, and ellipsometry Appropriate for materials scientists, chemists, physicists and electrical engineers involved in development of electronic materials Written by internationally respected professionals working in physics and electrical engineering departments and government laboratories Optical Properties of Materials and Their Applications, 2nd Edition is an ideal book for senior undergraduate and postgraduate students, and teaching and research professionals in the fields of physics, chemistry, chemical engineering, materials science, and materials engineering.

We have measured the optical properties of films of the organic semiconductors PTCDA and HBC, prepared by Organic Molecular Beam Expitaxy (OMBE), on different substrates by means of Differential Reflectance Spectroscopy (DRS). The optical setup used [51] allows to characterize the samples in situ and during the film growth. This enables us to directly follow the thickness dependent optical properties of the organic films, starting from submonolayer coverage up to thicker films on the order of 20 monolayers (ML) film thickness. However, due to the different optical nature of the different substrates used, i.e., mica, glass, Au(111), and HOPG, the DRS signal can not directly be interpreted in terms of the absorption of the films. Rather, the optical constants n (index of refraction) and k (absorption index) of the organic films have to be calculated to be able to discuss the spectral absorption of the films. We have proposed a method by which the calculation of the optical constants of thin films on arbitrary substrates from just one spectral measurement (in our case the DRS) becomes possible. The results fulfill a priori a Kramers-Kronig consistency, characteristic for physically meaningful values of the optical constants, and no specific model is needed to express the spectral behavior of the optical constants. Still, the requirement that the absorption index has to approach zero sufficiently at the measurement intervals restricts the application of our method to a class of materials, which exhibit distinct and well-separated absorption bands, like e.g. organic semiconductors. By means of appropriate extrapolation procedures, the method is able to account for small non-zero values of the absorption index at the boundaries of the measurement interval. Although we exclusively discussed the application of our method to differential reflectance spectra, it is anticipated that it works for all other optical quantities likewise.

Handbook of Optical Metrology: Principles and Applications begins by discussing key principles and techniques before exploring practical applications of optical metrology. Designed to provide beginners with an introduction to optical metrology without sacrificing academic rigor, this comprehensive text: Covers fundamentals of light sources, lenses, prisms, and mirrors, as well as optoelectronic sensors, optical devices, and optomechanical elements Addresses interferometry, holography, and speckle methods and applications Explains Moiré metrology and the optical heterodyne measurement method Delves into the specifics of diffraction, scattering, polarization, and near-field optics Considers applications for measuring length and size, displacement, straightness and parallelism, flatness, and three-dimensional shapes This new Second Edition is fully revised to reflect the latest developments. It also includes four new chapters—nearly 100 pages—on optical coherence tomography for industrial applications, interference microscopy for surface structure analysis, noncontact dimensional and profile metrology by video measurement, and optical metrology in manufacturing technology.