Sequential Logic Testing And Verification

In order to design and build computers that achieve and sustain high performance, it is essential that reliability issues be considered care fully. The problem has several aspects. Certainly, considering reliability implies that an engineer must be able to analyze how design decisions affect the incidence of failure. For instance, in order design reliable inte gritted circuits, it is necessary to analyze how decisions regarding design rules affect the yield, i.e., the percentage of functional chips obtained by the manufacturing process. Of equal importance in producing reliable computers is the detection of failures in its Very Large Scale Integrated (VLSI) circuit components, caused by errors in the design specification, implementation, or manufacturing processes. Design verification involves the checking of the specification of a design for correctness prior to carrying out an implementation. Implementation verification ensures that the manual design or automatic synthesis process is correct, i.e., the mask-level description correctly implements the specification. Manufacture test involves the checking of the complex fabrication process for correctness, i.e., ensuring that there are no manufacturing defects in the integrated circuit. It should be noted that all the above verification mechanisms deal not only with verifying the functionality of the integrated circuit but also its performance.

3. 2 Input Encoding Targeting Two-Level Logic . . . . . . . . 27 3. 2. 1 One-Hot Coding and Multiple-Valued Minimization 28 3. 2. 2 Input Constraints and Face Embedding 30 3. 3 Satisfying Encoding Constraints . . . . . . . 32 3. 3. 1 Definitions . . . . . . . . . . . . . . . 32 3. 3. 2 Column-Based Constraint Satisfaction 33 3. 3. 3 Row-Based Constraint Satisfaction . . 37 3. 3. 4 Constraint Satisfaction Using Dichotomies . 38 3. 3. 5 Simulated Annealing for Constraint Satisfaction 41 3. 4 Input Encoding Targeting Multilevel Logic. . 43 3. 4. 1 Kernels and Kernel Intersections . . . 44 3. 4. 2 Kernels and Multiple-Valued Variables 46 3. 4. 3 Multiple-Valued Factorization. . . . . 48 3. 4. 4 Size Estimation in Algebraic Decomposition . 53 3. 4. 5 The Encoding Step . 54 3. 5 Conclusion . . . . . . . . . 55 4 Encoding of Symbolic Outputs 57 4. 1 Heuristic Output Encoding Targeting Two-Level Logic. 59 4. 1. 1 Dominance Relations. . . . . . . . . . . . . . . . 59 4. 1. 2 Output Encoding by the Derivation of Dominance Relations . . . . . . . . . . . . . . . . . . . . . 60 . . 4. 1. 3 Heuristics to Minimize the Number of Encoding Bits . . . . . . . . . . . . 64 4. 1. 4 Disjunctive Relationships . . . . . . . . . . . 65 4. 1. 5 Summary . . . . . . . . . . . . . . . . . . 66 . . 4. 2 Exact Output Encoding Targeting Two-Level Logic. 66 4. 2. 1 Generation of Generalized Prime Implicants . 68 4. 2. 2 Selecting a Minimum Encodeable Cover . . . 68 4. 2. 3 Dominance and Disjunctive Relationships to S- isfy Constraints . . . . . . . . . . . 70 4. 2. 4 Constructing the Optimized Cover 73 4. 2. 5 Correctness of the Procedure . . 73 4. 2. 6 Multiple Symbolic Outputs . . .

This volume contains a collection of papers presented at the NATO Advanced Study Institute on ·Testing and Diagnosis of VLSI and ULSI" held at Villa Olmo, Como (Italy) June 22 -July 3,1987. High Density technologies such as Very-Large Scale Integration (VLSI), Wafer Scale Integration (WSI) and the not-so-far promises of Ultra-Large Scale Integration (ULSI), have exasperated the problema associated with the testing and diagnosis of these devices and systema. Traditional techniques are fast becoming obsolete due to unique requirements such as limited controllability and observability, increasing execution complexity for test vector generation and high cost of fault simulation, to mention just a few. New approaches are imperative to achieve the highly sought goal of the • three months· turn around cycle time for a state-of-the-art computer chip. The importance of testing and diagnostic processes is of primary importance if costs must be kept at acceptable levels. The objective of this NATO-ASI was to present, analyze and discuss the various facets of testing and diagnosis with respect to both theory and practice. The contents of this volume reflect the diversity of approaches currently available to reduce test and diagnosis time. These approaches are described in a concise, yet clear way by renowned experts of the field. Their contributions are aimed at a wide readership: the uninitiated researcher will find the tutorial chapters very rewarding. The expert wiII be introduced to advanced techniques in a very comprehensive manner.

Your road map for meeting today's digital testing challenges Today, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical to reliability, safety, and the bottom line. Yet, as digital systems become more ubiquitous and complex, the challenge of testing them has become more difficult. As one development group designing a RISC stated, "the work required to . . . test a chip of this size approached the amount of effort required to design it." A valued reference for nearly two decades, Digital Logic Testing and Simulation has been significantly revised and updated for designers and test engineers who must meet this challenge. There is no single solution to the testing problem. Organized in an easy-to-follow, sequential format, this Second Edition familiarizes the reader with the many different strategies for testing and their applications, and assesses the strengths and weaknesses of the various approaches. The book reviews the building blocks of a successful testing strategy and guides the reader on choosing the best solution for a particular application. Digital Logic Testing and Simulation, Second Edition covers such key topics as: * Binary Decision Diagrams (BDDs) and cycle-based simulation * Tester architectures/Standard Test Interface Language (STIL) * Practical algorithms written in a Hardware Design Language (HDL) * Fault tolerance * Behavioral Automatic Test Pattern Generation (ATPG) * The development of the Test Design Expert (TDX), the many obstacles encountered and lessons learned in creating this novel testing approach Up-to-date and comprehensive, Digital Logic Testing and Simulation is an important resource for anyone charged with pinpointing faulty products and assuring quality, safety, and profitability.

Presenting a comprehensive overview of the design automation algorithms, tools, and methodologies used to design integrated circuits, the Electronic Design Automation for Integrated Circuits Handbook is available in two volumes. The first volume, EDA for IC System Design, Verification, and Testing, thoroughly examines system-level design, microarchitectural design, logical verification, and testing. Chapters contributed by leading experts authoritatively discuss processor modeling and design tools, using performance metrics to select microprocessor cores for IC designs, design and verification languages, digital simulation, hardware acceleration and emulation, and much more. Save on the complete set.

An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)-based digital circuits. Chapter 2 introduces the major concepts of all test generation techniques such as redundancy, fault coverage, sensitization, and backtracking. Chapter 3 introduces the key concepts of testability, followed by some ad hoc design-for-testability rules that can be used to enhance testability of combinational circuits. Chapter 4 deals with test generation and response evaluation techniques used in BIST (built-in self-test) schemes for VLSI chips. Table of Contents: Introduction / Fault Detection in Logic Circuits / Design for Testability / Built-in Self-Test / References