Test System Design

Comprehensive coverage of recent developments in phase-locked loop technology The rapid growth of high-speed semiconductor and communication technologies has helped make phase-locked loops (PLLs) an essential part of memories, microprocessors, radio-frequency (RF) transceivers, broadband data communication systems, and other burgeoning fields. Complementing his 1996 Monolithic Phase-Locked Loops and Clock Recovery Circuits (Wiley-IEEE Press), Behzad Razavi now has collected the most important recent writing on PLL into a comprehensive, self-contained look at PLL devices, circuits, and architectures. Phase-Locking in High-Performance Systems: From Devices to Architectures' five original tutorials and eighty-three key papers provide an eminently readable foundation in phase-locked systems. Analog and digital circuit designers will glean a wide range of practical information from the book's . . . * Tutorials dealing with devices, delay-locked loops (DLLs), fractional-N synthesizers, bang-bang PLLs, and simulation of phase noise and jitter * In-depth discussions of passive devices such as inductors, transformers, and varactors * Papers on the analysis of phase noise and jitter in various types of oscillators * Concentrated examinations of building blocks, including the design of oscillators, frequency dividers, and phase/frequency detectors * Articles addressing the problem of clock generation by phase-locking for timing and digital applications, RF synthesis, and the application of phase-locking to clock and data recovery circuits In tandem with its companion volume, Phase-Locking in High-Performance Systems: From Devices to Architectures is a superb reference for anyone working on, or seeking to better understand, this rapidly-developing and increasingly central technology.

The system design interview is considered to be the most complex and most difficult technical job interview by many. Those questions are intimidating, but don't worry. It's just that nobody has taken the time to prepare you systematically. We take the time. We go slow. We draw lots of diagrams and use lots of examples. You'll learn step-by-step, one question at a time.Don't miss out.What's inside?- An insider's take on what interviewers really look for and why.- A 4-step framework for solving any system design interview question.- 16 real system design interview questions with detailed solutions.- 188 diagrams to visually explain how different systems work.

SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. Finally, the third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with the core selection process.

This book is about digital system testing and testable design. The concepts of testing and testability are treated together with digital design practices and methodologies. The book uses Verilog models and testbenches for implementing and explaining fault simulation and test generation algorithms. Extensive use of Verilog and Verilog PLI for test applications is what distinguishes this book from other test and testability books. Verilog eliminates ambiguities in test algorithms and BIST and DFT hardware architectures, and it clearly describes the architecture of the testability hardware and its test sessions. Describing many of the on-chip decompression algorithms in Verilog helps to evaluate these algorithms in terms of hardware overhead and timing, and thus feasibility of using them for System-on-Chip designs. Extensive use of testbenches and testbench development techniques is another unique feature of this book. Using PLI in developing testbenches and virtual testers provides a powerful programming tool, interfaced with hardware described in Verilog. This mixed hardware/software environment facilitates description of complex test programs and test strategies.

Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples. Most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (NOC) Testing, Software-Based Self-Testing, FPGA Testing, MEMS Testing, and System-In-Package (SIP) Testing, which are not yet available in any testing book. Covers the entire spectrum of VLSI testing and DFT architectures, from digital and analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits. Discusses future nanotechnology test trends and challenges facing the nanometer design era; promising nanotechnology test techniques, including Quantum-Dots, Cellular Automata, Carbon-Nanotubes, and Hybrid Semiconductor/Nanowire/Molecular Computing. Practical problems at the end of each chapter for students.

A guide to writing comprehensive test plans covering exploratory testing and feature specification; black and white box testing; security, usability, and maintainability; and load and stress testing Key FeaturesCover all key forms of testing for modern applications systematicallyUnderstand anti-patterns and pitfalls in system design with the help of practical examplesLearn the strengths and weaknesses of different forms of testing and how to combine them effectivelyBook Description Software Test Design details best practices for testing software applications and writing comprehensive test plans. Written by an expert with over twenty years of experience in the high-tech industry, this guide will provide you with training and practical examples to improve your testing skills. Thorough testing requires a thorough understanding of the functionality under test, informed by exploratory testing and described by a detailed functional specification. This book is divided into three sections, the first of which will describe how best to complete those tasks to start testing from a solid foundation. Armed with the feature specification, functional testing verifies the visible behavior of features by identifying equivalence partitions, boundary values, and other key test conditions. This section explores techniques such as black- and white-box testing, trying error cases, finding security weaknesses, improving the user experience, and how to maintain your product in the long term. The final section describes how best to test the limits of your application. How does it behave under failure conditions and can it recover? What is the maximum load it can sustain? And how does it respond when overloaded? By the end of this book, you will know how to write detailed test plans to improve the quality of your software applications. What you will learnUnderstand how to investigate new features using exploratory testingDiscover how to write clear, detailed feature specifi cationsExplore systematic test techniques such as equivalence partitioningUnderstand the strengths and weaknesses of black- and white-box testingRecognize the importance of security, usability, and maintainability testingVerify application resilience by running destructive testsRun load and stress tests to measure system performanceWho this book is for This book is for anyone testing software projects for mobile, web, or desktop applications. That includes Dedicated QA engineers managing software quality, Test and test automation engineers writing formal test plans, Test and QA managers running teams responsible for testing, Product owners responsible for product delivery, and Developers who want to improve the testing of their code.

Historically, the reliability growth process has been thought of, and treated as, a reactive approach to growing reliability based on failures "discovered" during testing or, most unfortunately, once a system/product has been delivered to a customer. As a result, many reliability growth models are predicated on starting the reliability growth process at test time "zero", with some initial level of reliability (usually in the context of a time-based measure such as Mean Time Between Failure (MTBF)). Time "zero" represents the start of testing, and the initial reliability of the test item is based on its inherent design. The problem with this approach, still predominant today, is that it ignores opportunities to grow reliability during the design of a system or product, i.e., opportunities to go into reliability growth testing with a higher initial inherent reliability at time zero. In addition to the traditional approaches to reliability growth during test, this book explores the activities and opportunities that can be leveraged to promote and achieve reliability growth during the design phase of the overall system life cycle. The ability to do so as part of an integrated, proactive design environment has significant implications for developing and delivering reliable items quickly, on time and within budget. This book offers new definitions of how failures can be characterized, and how those new definitions can be used to develop metrics that will quantify how effective a Design for Reliability (DFR) process is in (1) identifying failure modes and (2) mitigating their root failure causes. Reliability growth can only occur in the presence of both elements.