The Fundamentals Of Mixed Signal Testing

With the proliferation of complex semiconductor devices containing digital, analog, mixed-signal and radio-frequency circuits, the economics of test has come to the forefront and today's engineer needs to be fluent in all four circuit types. Having access to a book that covers these topicswill help the evolving test engineer immensely and will be an invaluable resource. In addition, the second edition includes lengthy discussion on RF circuits, high-speed I/Os and probabilistic reasoning. Appropriate for the junior/senior university level, this textbook includes hundreds of examples,exercises and problems.

Integrated circuits incorporating both digital and analog functions have become increasingly prevalent in the semiconductor industry. Mixed-signal IC test and measurement has grown into a highly specialized field of electrical engineering. It has become harder to hire and train new engineers to become skilled mixed-signal test engineers. The slow learning curve for mixed-signal test engineers is largely due to the shortage of written materials and university-level courses on the subject of mixed-signal testing. While many books have been devoted to the subject of digital test and testability, the same cannot be said for analog and mixed-signal automated test and measurement. This book was written in response ot the shortage of basic course material for mixed-signal test and measurement. The book assumes a solid background in analog and digital circuits as well as a working knowledge of computers and computer programming. A background in digital signal processing and statistical analysis is also helpful, though not absolutely necessary. This material is designed to be useful as both a university textbook and as a reference manual for the beginning professional test engineer. The prerequisite for this book is a junior level course in linear continuous-time and discrete-time systems, as well as exposure ot elementary probability and statistical concepts. Chapter 1 presents an introduction to the context in which mixed-singal testing is performed and why it is necessary. Chapter 2 examines the process by which test programs are generated, from device data sheet to test plan to test code. Test program structure and functionality are also discussed in Chapter 2. Chapter 3 introduces basic DC measurement definitions, including continuity, leakage, offset, gain, DC power supply rejection ratio, and many other types of fundamental DC measurements. Chapter 4 covers the basics of absolute accuracy, resolution, software calibration, standards traceability, and measurement repeatability. In addition, basic data analysis is presented in Chapter 4. A more thorough treatment of data analysis and statistical analysis is delayed until Chapter 15. Chapter 5 takes a closer look at the architecture of a generic mixed-signal ATE tester. The generic tester includes instruments such as DC sources, meters, waveform digitizers, arbitrary waveform generators, and digital pattern generators with source and capture functionality. Chapter 6 presents an introduction to both ADC and DAC sampling theory. DAC sampling theory is applicable to both DAC circuits in the device under test and to the arbitrary waveform generators in a mixed-signal tester. ADC sampling theory is applicable to both ADC circuits in the device under test and to waveform digitizers in a mixed-signal tester. Coherent multi-tone sample sets are also introduced as an introduction to DSP based testing. Chapter 7 further develops sampling theory concepts and DSP-based testing methodologies, which are at the core of many mixed-signal test and measurement techniques. FFT fundamentals, windowing, frequency domain filtering, and other DSP-based testing fundamentals are covered in Chapter 6 and 7. Chapter 8 shows how basic AC channel tests can be performed economicaly using DSP-based testing. This chapter covers only non-sampled channels, consisting of combinations of op-amps, analog filters, PGAs and other continuous-time circuits. Chapter 9 explores many of these same tests as they are applied to sampled channels, which include DACs, ADCs, sample and hold (S/H) amplifiers, etc. Chapter 10 explains how the basic accuracy of ATE test equipment can be extended using specialized software routines. This subject is not necessarily taught in formal ATE tester classes, yet it is critical in the accurate measurement of many DUT performance parameters. Testing of DACs is covered in Chapter 11. Several kinds of DACs are studied, including traditional binary-weighted, resistive ladder, pulse with modulation (PWM), and sigma delta architectures. Traditional measurements like INL, DNL and absolute error are discussed. Chapter 12 builds upon the concepts in Chapter 11 to show how ADCs are commonly tested. Again, several different kinds of ADC's are studied, including binary-weighted, dual-slope, flash, semi-flash, and sigma-delta architectures. The weaknesses of each design are expalined, as well as the common methodologies used to probe their weaknesses. Chapter 13 explores the gray art of mixed-signal DIB design. Topics of interest include component selection, power and ground layout, crosstalk, shielding, transmission lines, and tester loading. Chapter 13 also illustrates several common DIB circuits and their use in mixed-signal testing. Chapter 14 gives a brief introduction to some of the techniques for analog and mixed-signal design for test. There are fewer structured approaches for mixed-signal DfT than for purely digital DfT. The more common ad-hoc methods are explained, as well as some of the industry standards such as IEEE Std. 1149.1 and 1149.4. A brief review of statistical analysis and Gaussian distributions is presented in Chapter 15. This chapter also shows how measurement results can be analyzed and viewed using a variety of software tools and display formats. Datalogs, shmoo plots, and histograms are discussed. Also, statistical process control (SPC) is explained, including a discussion of process control metrics such as Cp and Cpk. Chapter 16 examines the economis of production testing, The economics of testing are affected by many factors such as equipment purchase price, test floor overhead costs, test time, dual-head testing, multi-site testing, and time to market. A test engineer's debugging skills heavily impacts time to market. Chapter 16 examines the test debugging process to attempt to set down some general guidelines for debugging mixed-signal test programs. Finally, emerging trends that affect test economics and test development time are presented in Chapter 16. Some or all these trends will shape the future course of mixed-siganl test and measurement.

Answers the commonly asked questions about how digital signal processing-based machines work and what role DSP plays in the process. It shows you how DSP performs in real-test situations and uses mathematical concepts rather than derivations. The text addresses difficult test problems and their solutions resulting from the union of automatic test equipment (ATE) and DSP. The author establishes a philosophy of DSP-based testing describing how to think, how to approach a problem, how to create a solution, and how to determine if it really works properly.

Mixed Signal Test Methods Demystified is a less theoretical, less mathematical, and more applications-oriented approach than other books available on the topic. In effect, this book will give readers a "just in time" understanding of the essentials of mixed signal testing techniques. Emphasis will be on commonly used devices and systems (such as PLLs and DSP) that engineers encounter in their daily tasks. Sampling theory is covered in detail, as this is the foundation for understanding all mixed signal testing technique, and readers will have a strong intuitive grasp of this topic after finishing this book. Baker aims to develop an intuitive understanding of mixed signal testing that minimizes the mathematics required and is germane to the sort of testing requirements found in typical engineering situations. *Takes a less theoretical, less mathematical, and more applications-oriented approach *Emphasizes commonly used devices and systems that engineers encounter in their daily tasks *Aims to develop an intuitive understanding of mixed signal testing

A practical guide to analog and mixed-signal electronics, with an emphasis on design problems and applications This book provides an in-depth coverage of essential analog and mixed-signal topics such as power amplifiers, active filters, noise and dynamic range, analog-to-digital and digital-to-analog conversion techniques, phase-locked loops, and switching power supplies. Readers will learn the basics of linear systems, types of nonlinearities and their effects, op-amp circuits, the high-gain analog filter-amplifier, and signal generation. The author uses system design examples to motivate theoretical explanations and covers system-level topics not found in most textbooks. Provides references for further study and problems at the end of each chapter Includes an appendix describing test equipment useful for analog and mixed-signal work Examines the basics of linear systems, types of nonlinearities and their effects, op-amp circuits, the high-gain analog filter-amplifier, and signal generation Comprehensive and detailed, Analog and Mixed-Signal Electronics is a great introduction to analog and mixed-signal electronics for EE undergraduates, advanced electronics students, and for those involved in computer engineering, biomedical engineering, computer science, and physics.

This is the third edition of the European Workshop on Microelectronics Education (EWME). A steady-state regime has now been reached. An international community of university teachers is constituted; they exchange their experience and their pedagogical tools. They discuss the best ways to transfer the rapidly changing techniques to their students, and to introduce them to the new physical and mathematical concepts and models for the innovative techniques, devices, circuits and design methods. The number of abstracts submitted to EWME 2000 (about one hundred) enabled the scientific committee to proceed to a clear selection. EWME is a European meeting. Indeed, authors from 20 different European countries contribute to this volume. Nevertheless, the participation of authors from Brazil, Canada, China, New Zealand, and USA, shows that the workshop gradually attains an international dimension. th The 20 century can be characterized as the "century of electron". The electron, as an elementary particle, was discovered by J.J. Thomson in 1897, and was rapidly used to transfer energy and information. Thanks to electron, universe and micro-cosmos could be explored. Electron became the omnipotent and omnipresent, almost immaterial, angel of our W orId. This was made possible thanks to electronics and, for the last 30 years, to microelectronics. Microelectronics not only modified and even radically transformed the industrial and the every-day landscapes, but it also led to the so-called "information revolution" with which begins the 21 st century.