The Tao Of Microelectronics
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The Tao of Microelectronics
Author | : Y Zhang |
Publsiher | : Myprint |
Total Pages | : 120 |
Release | : 2014-12-18 |
Genre | : Electronic Book |
ISBN | : 1681748681 |
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The Tao of Microelectronics
Author | : Yumin Zhang,Institute of Physics (Great Britain) |
Publsiher | : Unknown |
Total Pages | : 135 |
Release | : 2014 |
Genre | : Microelectronics |
ISBN | : 1627056734 |
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Microelectronics covers various circuits with different kinds of electronic devices, and hundreds of equations are involved for these circuits. It is often considered a "black art" instead of an engineering field. The author believes that in order to understand microelectronics, one needs to pay more attention to the ideas or Tao behind various intricate circuits. This book is not intended to replace those classic textbooks on microelectronics, but it can play a supplementary role by highlighting the key ideas and techniques.
The Tao of Microelectronics
Author | : Yumin Zhang |
Publsiher | : Morgan & Claypool Publishers |
Total Pages | : 118 |
Release | : 2014-12-01 |
Genre | : Technology & Engineering |
ISBN | : 9781627054539 |
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Microelectronics is a challenging course to many undergraduate students and is often described as very messy. Before taking this course, all the students have learned circuit analysis, where basically all the problems can be solved by applying Kirchhoff's
Microelectronics Technology and Devices SBMicro 2008
Author | : Jacobus W. Swart |
Publsiher | : The Electrochemical Society |
Total Pages | : 679 |
Release | : 2008-08 |
Genre | : Science |
ISBN | : 9781566776462 |
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The SBMicro symposium is a forum dedicated to fabrication and modeling of microsystems, integrated circuits and devices. The goal of the symposium is to bring together researchers in the areas of processing, materials, characterization, modeling and TCAD of integrated circuits, microsensors, microactuators and MEMS. This issue of ECS Transactions contains the papers presented at the 2008 conference.
Microelectronics Failure Analysis
Author | : Anonim |
Publsiher | : ASM International |
Total Pages | : 813 |
Release | : 2004-01-01 |
Genre | : Technology & Engineering |
ISBN | : 9780871708045 |
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For newcomers cast into the waters to sink or swim as well as seasoned professionals who want authoritative guidance desk-side, this hefty volume updates the previous (1999) edition. It contains the work of expert contributors who rallied to the job in response to a committee's call for help (the committee was assigned to the update by the Electron
Introduction to Microelectronics to Nanoelectronics
Author | : Manoj Kumar Majumder,Vijay Rao Kumbhare,Aditya Japa,Brajesh Kumar Kaushik |
Publsiher | : CRC Press |
Total Pages | : 350 |
Release | : 2020-11-25 |
Genre | : Science |
ISBN | : 9781000223095 |
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Focussing on micro- and nanoelectronics design and technology, this book provides thorough analysis and demonstration, starting from semiconductor devices to VLSI fabrication, designing (analog and digital), on-chip interconnect modeling culminating with emerging non-silicon/ nano devices. It gives detailed description of both theoretical as well as industry standard HSPICE, Verilog, Cadence simulation based real-time modeling approach with focus on fabrication of bulk and nano-devices. Each chapter of this proposed title starts with a brief introduction of the presented topic and ends with a summary indicating the futuristic aspect including practice questions. Aimed at researchers and senior undergraduate/graduate students in electrical and electronics engineering, microelectronics, nanoelectronics and nanotechnology, this book: Provides broad and comprehensive coverage from Microelectronics to Nanoelectronics including design in analog and digital electronics. Includes HDL, and VLSI design going into the nanoelectronics arena. Discusses devices, circuit analysis, design methodology, and real-time simulation based on industry standard HSPICE tool. Explores emerging devices such as FinFETs, Tunnel FETs (TFETs) and CNTFETs including their circuit co-designing. Covers real time illustration using industry standard Verilog, Cadence and Synopsys simulations.
PVD for Microelectronics Sputter Desposition to Semiconductor Manufacturing
Author | : Anonim |
Publsiher | : Elsevier |
Total Pages | : 434 |
Release | : 1998-10-29 |
Genre | : Science |
ISBN | : 9780080542928 |
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Physics of Thin Films is one of the longest running continuing series in thin film science, consisting of 25 volumes since 1963. The series contains quality studies of the properties of various thin films materials and systems.In order to be able to reflect the development of today's science and to cover all modern aspects of thin films, the series, starting with Volume 20, has moved beyond the basic physics of thin films. It now addresses the most important aspects of both inorganic and organic thin films, in both their theoretical as well as technological aspects. Therefore, in order to reflect the modern technology-oriented problems, the title has been slightly modified from Physics of Thin Films to Thin Films.This volume, part of the Thin Films Series, has been wholly written by two authors instead of showcasing several edited manuscripts.
Hermeticity Testing of MEMS and Microelectronic Packages
Author | : Suzanne Costello,Marc P.Y. Desmulliez |
Publsiher | : Artech House |
Total Pages | : 197 |
Release | : 2013-10-01 |
Genre | : Technology & Engineering |
ISBN | : 9781608075270 |
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Packaging of microelectronics has been developing since the invention of the transistor in 1947. With the increasing complexity and decreasing size of the die, packaging requirements have continued to change. A step change in package requirements came with the introduction of the Micro-Electro-Mechanical System (MEMS) whereby interactions with the external environment are, in some cases, required. This resource is a rapid, definitive reference on hermetic packaging for the MEMS and microelectronics industry, giving practical guidance on traditional and newly developed test methods. This book includes up-to-date and applicable test methods for today’s package types. The authors cover the history and development of packaging, along with a view to understanding initial hermeticity testing requirements and the subsequent limitations of these methods when applied to new package types.