Variation In The Input
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Interpreting language learning data
Author | : Amanda Edmonds,Pascale Leclercq,Aarnes Gudmestad |
Publsiher | : BoD – Books on Demand |
Total Pages | : 250 |
Release | : 2020-09-28 |
Genre | : Language Arts & Disciplines |
ISBN | : 9783961102839 |
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This book provides a forum for methodological discussions emanating from researchers engaged in studying how individuals acquire an additional language. Whereas publications in the field of second language acquisition generally report on empirical studies with relatively little space dedicated to questions of method, the current book gave authors the opportunity to more fully develop a discussion piece around a methodological issue in connection with the interpretation of language-learning data. The result is a set of seven thought-provoking contributions from researchers with diverse interests. Three main topics are addressed in these chapters: the role of native-speaker norms in second-language analyses, the impact of epistemological stance on experimental design and/or data interpretation, and the challenges of transcription and annotation of language-learning data, with a focus on data ambiguity. Authors expand on these crucial issues, reflect on best practices, and provide in many instances concrete examples of the impact they have on data interpretation.
Stream of Variation Modeling and Analysis for Multistage Manufacturing Processes
Author | : Jianjun Shi |
Publsiher | : CRC Press |
Total Pages | : 492 |
Release | : 2006-12-04 |
Genre | : Business & Economics |
ISBN | : 9781420003901 |
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Variability arises in multistage manufacturing processes (MMPs) from a variety of sources. Variation reduction demands data fusion from product/process design, manufacturing process data, and quality measurement. Statistical process control (SPC), with a focus on quality data alone, only tells half of the story and is a passive method, taking corre
Stochastic Process Variation in Deep Submicron CMOS
Author | : Amir Zjajo |
Publsiher | : Springer Science & Business Media |
Total Pages | : 207 |
Release | : 2013-11-19 |
Genre | : Technology & Engineering |
ISBN | : 9789400777811 |
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One of the most notable features of nanometer scale CMOS technology is the increasing magnitude of variability of the key device parameters affecting performance of integrated circuits. The growth of variability can be attributed to multiple factors, including the difficulty of manufacturing control, the emergence of new systematic variation-generating mechanisms, and most importantly, the increase in atomic-scale randomness, where device operation must be described as a stochastic process. In addition to wide-sense stationary stochastic device variability and temperature variation, existence of non-stationary stochastic electrical noise associated with fundamental processes in integrated-circuit devices represents an elementary limit on the performance of electronic circuits. In an attempt to address these issues, Stochastic Process Variation in Deep-Submicron CMOS: Circuits and Algorithms offers unique combination of mathematical treatment of random process variation, electrical noise and temperature and necessary circuit realizations for on-chip monitoring and performance calibration. The associated problems are addressed at various abstraction levels, i.e. circuit level, architecture level and system level. It therefore provides a broad view on the various solutions that have to be used and their possible combination in very effective complementary techniques for both analog/mixed-signal and digital circuits. The feasibility of the described algorithms and built-in circuitry has been verified by measurements from the silicon prototypes fabricated in standard 90 nm and 65 nm CMOS technology.
RF Frontend Design for Process Variation Tolerant Receivers
Author | : Pooyan Sakian,Reza Mahmoudi,Arthur van Roermund |
Publsiher | : Springer Science & Business Media |
Total Pages | : 181 |
Release | : 2012-02-22 |
Genre | : Technology & Engineering |
ISBN | : 9781461421221 |
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This book discusses a number of challenges faced by designers of wireless receivers, given complications caused by the shrinking of electronic and mobile devices circuitry into ever-smaller sizes and the resulting complications on the manufacturability, production yield, and the end price of the products. The authors describe the impact of process technology on the performance of the end product and equip RF designers with countermeasures to cope with such problems. The mechanisms by which these problems arise are analyzed in detail and novel solutions are provided, including design guidelines for receivers with robustness to process variations and details of circuit blocks that obtain the required performance level. Describes RF receiver frontends and their building blocks from a system- and circuit-level perspective; Provides system-level analysis of a generic RF receiver frontend with robustness to process variations; Includes details of CMOS circuit design at 60GHz and reconfigurable circuits at 60GHz; Covers millimeter-wave circuit design with robustness to process variations.
Estimating Trading day Variation in Monthly Economic Time Series
Author | : Allan H. Young |
Publsiher | : Unknown |
Total Pages | : 32 |
Release | : 1965 |
Genre | : Seasonal variations (Economics) |
ISBN | : UCD:31175017353585 |
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Variation in the Input
Author | : Merete Anderssen,Kristine Bentzen,Marit Westergaard |
Publsiher | : Springer Science & Business Media |
Total Pages | : 280 |
Release | : 2010-09-22 |
Genre | : Language Arts & Disciplines |
ISBN | : 9789048192076 |
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The topic of variation in language has received considerable attention in the field of general linguistics in recent years. This includes research on linguistic micro-variation that is dependent on fine distinctions in syntax and information structure. However, relatively little work has been done on how this variation is acquired. This book focuses on how different types of variation are expressed in the input and how this is acquired by young children. The collection of papers includes studies of the acquisition of variation in a number of different languages, including English, German, Greek, Italian, Korean, Norwegian, Swiss German, Ukrainian, and American Sign Language. Different kinds of linguistic variation are considered, ranging from pure word order variation to optionally doubly filled COMPs and the resolution of scopal ambiguities. In addition, papers in the volume deal with the extreme case of variation found in bilingual acquisition.
Nanometer Variation Tolerant SRAM
Author | : Mohamed Abu Rahma,Mohab Anis |
Publsiher | : Springer Science & Business Media |
Total Pages | : 176 |
Release | : 2012-09-26 |
Genre | : Technology & Engineering |
ISBN | : 9781461417491 |
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Variability is one of the most challenging obstacles for IC design in the nanometer regime. In nanometer technologies, SRAM show an increased sensitivity to process variations due to low-voltage operation requirements, which are aggravated by the strong demand for lower power consumption and cost, while achieving higher performance and density. With the drastic increase in memory densities, lower supply voltages, and higher variations, statistical simulation methodologies become imperative to estimate memory yield and optimize performance and power. This book is an invaluable reference on robust SRAM circuits and statistical design methodologies for researchers and practicing engineers in the field of memory design. It combines state of the art circuit techniques and statistical methodologies to optimize SRAM performance and yield in nanometer technologies. Provides comprehensive review of state-of-the-art, variation-tolerant SRAM circuit techniques; Discusses Impact of device related process variations and how they affect circuit and system performance, from a design point of view; Helps designers optimize memory yield, with practical statistical design methodologies and yield estimation techniques.
Analog Circuit Design for Process Variation Resilient Systems on a Chip
Author | : Marvin Onabajo,Jose Silva-Martinez |
Publsiher | : Springer Science & Business Media |
Total Pages | : 183 |
Release | : 2012-03-08 |
Genre | : Technology & Engineering |
ISBN | : 9781461422952 |
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This book describes several techniques to address variation-related design challenges for analog blocks in mixed-signal systems-on-chip. The methods presented are results from recent research works involving receiver front-end circuits, baseband filter linearization, and data conversion. These circuit-level techniques are described, with their relationships to emerging system-level calibration approaches, to tune the performances of analog circuits with digital assistance or control. Coverage also includes a strategy to utilize on-chip temperature sensors to measure the signal power and linearity characteristics of analog/RF circuits, as demonstrated by test chip measurements. Describes a variety of variation-tolerant analog circuit design examples, including from RF front-ends, high-performance ADCs and baseband filters; Includes built-in testing techniques, linked to current industrial trends; Balances digitally-assisted performance tuning with analog performance tuning and mismatch reduction approaches; Describes theoretical concepts as well as experimental results for test chips designed with variation-aware techniques.