X Ray Diffraction By Polycrystalline Materials

This book presents a physical approach to the diffraction phenomenon and its applications in materials science. An historical background to the discovery of X-ray diffraction is first outlined. Next, Part 1 gives a description of the physical phenomenon of X-ray diffraction on perfect and imperfect crystals. Part 2 then provides a detailed analysis of the instruments used for the characterization of powdered materials or thin films. The description of the processing of measured signals and their results is also covered, as are recent developments relating to quantitative microstructural analysis of powders or epitaxial thin films on the basis of X-ray diffraction. Given the comprehensive coverage offered by this title, anyone involved in the field of X-ray diffraction and its applications will find this of great use.

Elementary crystallography. The production and properties of X-rays. Fundamental principles of X-ray diffraction. Photographic powder techniques. Diffractometric powder technique. The interpretation of powder diffraction data. Qualitative and quantitative analysis of crystalline powders. The precision determination of lattice constants. Crystallite size and lattice strains from line broadening. Investigation of preferred orientation and texture. Stress measurements in metals. Radial-distribution studies of noncrystalline materials. Layout for a diffraction laboratory. The handling and processing of X-ray film. Miscellaneous constants and numerical data. International atomic weights. Mass absorption coefficients u/p of the elements (Z=1 to 83) for a selection of wavelenghts. Quadratic forms for the cubic system. Atomic and ionic scattering factors. Lorentz and polarization factors. Temperature factor table. Warren's powder pattern power theorem.

X-ray diffraction crystallography for powder samples is a well-established and widely used method. It is applied to materials characterization to reveal the atomic scale structure of various substances in a variety of states. The book deals with fundamental properties of X-rays, geometry analysis of crystals, X-ray scattering and diffraction in polycrystalline samples and its application to the determination of the crystal structure. The reciprocal lattice and integrated diffraction intensity from crystals and symmetry analysis of crystals are explained. To learn the method of X-ray diffraction crystallography well and to be able to cope with the given subject, a certain number of exercises is presented in the book to calculate specific values for typical examples. This is particularly important for beginners in X-ray diffraction crystallography. One aim of this book is to offer guidance to solving the problems of 90 typical substances. For further convenience, 100 supplementary exercises are also provided with solutions. Some essential points with basic equations are summarized in each chapter, together with some relevant physical constants and the atomic scattering factors of the elements.

With contributions by Paul F. Fewster and Christoph Genzel While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of thin films. Very much an interdisciplinary field, chemists, biochemists, materials scientists, physicists and engineers all have a common interest in thin films and their manifold uses and applications. Grain size, porosity, density, preferred orientation and other properties are important to know: whether thin films fulfill their intended function depends crucially on their structure and morphology once a chemical composition has been chosen. Although their backgrounds differ greatly, all the involved specialists a profound understanding of how structural properties may be determined in order to perform their respective tasks in search of new and modern materials, coatings and functions. The author undertakes this in-depth introduction to the field of thin film X-ray characterization in a clear and precise manner.

This book provides a concise survey of modern theoretical concepts of X-ray materials analysis. The principle features of the book are: basics of X-ray scattering, interaction between X-rays and matter and new theoretical concepts of X-ray scattering. The various X-ray techniques are considered in detail: high-resolution X-ray diffraction, X-ray reflectivity, grazing-incidence small-angle X-ray scattering and X-ray residual stress analysis. All the theoretical methods presented use the unified physical approach. This makes the book especially useful for readers learning and performing data analysis with different techniques. The theory is applicable to studies of bulk materials of all kinds, including single crystals and polycrystals as well as to surface studies under grazing incidence. The book appeals to researchers and graduate students alike.

This third edition has been extended considerably to incorporate more information on instrument influences on the interpretation of X-ray scattering profiles and reciprocal space maps. Another significant inclusion is on the scattering from powder samples, covering a new theoretical approach that explains features that conventional theory cannot. The new edition includes some of the latest methodologies and theoretical treatments, including the latest thinking on dynamical theory and diffuse scattering. Recent advances in detectors also present new opportunities for rapid data collection and some very different approaches in data collection techniques; the possibilities associated with these advances will be included.This edition should be of interest to those who use X-ray scattering to understand more about their samples, so that they can make a better judgment of the parameter and confidence levels in their analyses, and how the combination of instrument, sample and detection should be considered as a whole to ensure this.

This book presents reviews of various aspects of radiation/matter interactions, be these instrumental developments, the application of the study of the interaction of X-rays and materials to a particular scientific field, or specific methodological approaches. The overall aim of the book is to provide reference summaries for a range of specific subject areas within a pedagogical framework. Each chapter is written by an author who is well known within their field and who has delivered an invited lecture on their subject area as part of the “RX2009 – X-rays and Materials” colloquium that took place in December 2009 at Orsay in France. The book consists of five chapters on the subject of X-ray diffraction, scattering and absorption. Chapter 1 gives a detailed presentation of the capabilities and potential of beam lines dedicated to condensed matter studies at the SOLEIL synchrotron radiation source. Chapter 2 focuses on the study of nanoparticles using small-angle X-ray scattering. Chapter 3 discusses the quantitative studies of this scattering signal used to analyze these characteristics in detail. Chapter 4 discusses relaxor materials, which are ceramics with a particularly complex microstructure. Chapter 5 discusses an approach enabling the in situ analysis of these phase transitions and their associated microstructural changes.