X Ray Tomography In Industrial Metrology

X-ray computed tomography has been used for several decades as a tool for measuring the three-dimensional geometry of the internal organs in medicine. However, in recent years, we have seen a move in manufacturing industries for the use of X-ray computed tomography; first to give qualitative information about the internal geometry and defects in a component, and more recently, as a fully-quantitative technique for dimensional and materials analysis. This trend is primarily due to the ability of X-ray computed tomography to give a high-density and multi-scale representation of both the external and internal geometry of a component, in a non-destructive, non-contact and relatively fast way. But, due to the complexity of X-ray computed tomography, there are remaining metrological issues to solve and the specification standards are still under development. This book will act as a one-stop-shop resource for students and users of X-ray computed tomography in both academia and industry. It presents the fundamental principles of the technique, detailed descriptions of the various components (hardware and software), current developments in calibration and performance verification and a wealth of example applications. The book will also highlight where there is still work to do, in the perspective that X-ray computed tomography will be an essential part of Industry 4.0.

While books on the medical applications of x-ray imaging exist, there is not one currently available that focuses on industrial applications. Full of color images that show clear spectrometry and rich with applications, X-Ray Imaging fills the need for a comprehensive work on modern industrial x-ray imaging. It reviews the fundamental science of x-ray imaging and addresses equipment and system configuration. Useful to a broad range of radiation imaging practitioners, the book looks at the rapid development and deployment of digital x-ray imaging system.

This book provides easy-to-understand explanations to systematically and comprehensively describe the X-ray CT technologies, techniques, and skills used for industrial and scientific purposes. Included are many references along with photographs, figures, and equations prepared by the author. These features all facilitate the reader's gaining a deeper understanding of the topics being discussed. The book presents expertise not only on fundamentals but also about hardware, software, and analytical methods for the benefit of technical users. The book targets engineers, researchers, and students who are involved in research, development, design, and quality assurance in industry and academia.

This book gathers the proceedings of the 5th International Conference on the Industry 4.0 Model for Advanced Manufacturing (AMP 2020), held in Belgrade, Serbia, on 1–4 June 2020. The event marks the latest in a series of high-level conferences that bring together experts from academia and industry to exchange knowledge, ideas, experiences, research findings, and information in the field of manufacturing. The book addresses a wide range of topics, including: design of smart and intelligent products, developments in CAD/CAM technologies, rapid prototyping and reverse engineering, multistage manufacturing processes, manufacturing automation in the Industry 4.0 model, cloud-based products, and cyber-physical and reconfigurable manufacturing systems. By providing updates on key issues and highlighting recent advances in manufacturing engineering and technologies, the book supports the transfer of vital knowledge to the next generation of academics and practitioners. Further, it will appeal to anyone working or conducting research in this rapidly evolving field.

Quality assurance in aviation and space industry poses extraordinary challenges for measurement engineers. High standards for safety-critical parts must be maintained without reducing manufacturing speed and overall productivity. At the same time, the demands on the aerospace industry to develop aircraft that are as fuel-efficient and quiet as possible have increased enormously. And the aerospace industry wants to meet these requirements, whether in terms of noise emissions or fuel consumption. This is where industrial metrology with all its inspection capabilities, sensors and software solutions can make a valuable contribution. These possibilities are shown in this book. The demands placed on the aerospace industry are reinforced by strict regulations and approval processes – including additional specifications, traceability, conformity and certification standards. Be it EN/AS 9100, NadCap, test procedures according to AS 13003, 13006, EN/AS 9138 or others, the implementation of these procedures with coordinate measuring systems is part of this book.

The scales involved in modern semiconductor manufacturing and microelectronics continue to plunge downward. Effective and accurate characterization of materials with thicknesses below a few nanometers can be achieved using x-rays. While many books are available on the theory behind x-ray metrology (XRM), X-Ray Metrology in Semiconductor Manufacturing is the first book to focus on the practical aspects of the technology and its application in device fabrication and solving new materials problems. Following a general overview of the field, the first section of the book is organized by application and outlines the techniques that are best suited to each. The next section delves into the techniques and theory behind the applications, such as specular x-ray reflectivity, diffraction imaging, and defect mapping. Finally, the third section provides technological details of each technique, answering questions commonly encountered in practice. The authors supply real examples from the semiconductor and magnetic recording industries as well as more than 150 clearly drawn figures to illustrate the discussion. They also summarize the principles and key information about each method with inset boxes found throughout the text. Written by world leaders in the field, X-Ray Metrology in Semiconductor Manufacturing provides real solutions with a focus on accuracy, repeatability, and throughput.

Industrial Tomography: Systems and Applications, Second Edition thoroughly explores the important techniques of industrial tomography, also discusses image reconstruction, systems, and applications. This book presents complex processes, including the way three-dimensional imaging is used to create multiple cross-sections, and how computer software helps monitor flows, filtering, mixing, drying processes, and chemical reactions inside vessels and pipelines. This book is suitable for materials scientists and engineers and applied physicists working in the photonics and optoelectronics industry or in the applications industries. Provides a comprehensive discussion on the different formats of tomography, including advances in visualization and data fusion Includes an excellent overview of image reconstruction using a wide range of applications Presents a comprehensive discussion of tomography systems and their applications in a wide variety of industrial processes