Analysis Of Residual Stress By Diffraction Using Neutron And Synchrotron Radiation

While residual stress can be a problem in many industries and lead to early failure of component, it can also be introduced deliberately to improve lifetimes. Knowledge of the residual stress state in a component can be critical for quality control of surface engineering processes or vital to performing an accurate assessment of component life unde

Volume is indexed by Thomson Reuters CPCI-S (WoS). This collection addresses specific topics within the field of stress measurement in solids using neutrons, X-rays and synchrotron radiation. Particular attention is paid to multidisciplinary approaches involving an understanding of the measured stress field and the implications of the stress field for the behaviour of materials and components.

This book presents the proceedings of the 9th International Conference on Mechanical Stress Evaluation by Neutron and Synchrotron Radiation which was hosted by the South African Nuclear Energy Corporation (Necsa) SOC Limited in cooperation with the International Atomic Energy Agency (IAEA). The conference topics included deformation & modeling, processing & welding, techniques & instruments, mechanical methods vs. diffraction, microstructure & characterization, surface modification & coatings, 3D/4D characterization and fatigue, creep & plasticity.

Besides its coverage of the four important aspects of synchrotron sources, materials and material processes, measuring techniques, and applications, this ready reference presents both important method types: diffraction and tomography. Following an introduction, a general section leads on to methods, while further sections are devoted to emerging methods and industrial applications. In this way, the text provides new users of large-scale facilities with easy access to an understanding of both the methods and opportunities offered by different sources and instruments.

Selected, Peer reviewed papers from the MECA SENS V (The 5th International Conference on Mechanical Stress Evaluation by Neutrons and Synchrotron Radiation)/ QuBS2009 (The 3rd International Symposium of Quantum Beam Science Directorate of Japan Atomic Energy Agency), Mito 10 - 12 November 2009

Over the past 25 years the field of neutron diffraction for residual stress characterization has grown tremendously, and has matured from the stage of trial demonstrations to provide a practical tool with widespread applications in materials science and engineering. While the literature on the subject has grown commensurately, it has also remained

Volume is indexed by Thomson Reuters CPCI-S (WoS). The collection shows the importance of neutron and synchrotron radiation in the evaluation of mechanical stresses. It gathers the current knowledge from those concerned with the mechanical stress evaluation of materials and components using neutron and synchrotron radiation. It also gives an interesting "snap-shot" of progress in the field. The wide array contributions focus on the following key topics: Stress evaluation using neutrons, synchrotron radiation and X-rays; Development of measurement methods and instrumentation; Material processing and residual stresses; The influence of residual stresses on the physical and mechanical properties of materials and components; Measurement and assessment of residual micro-stresses and intergranular stresses; Residual strains and stresses in complex materials (e.g. multi-phase and biomaterials); Industrial applications of residual stress analysis using neutrons, synchrotron radiation and X-rays; and Complementary techniques for residual stress measurements.

Retaining its proven concept, the second edition of this ready reference specifically addresses the need of materials engineers for reliable, detailed information on modern material characterization methods. As such, it provides a systematic overview of the increasingly important field of characterization of engineering materials with the help of neutrons and synchrotron radiation. The first part introduces readers to the fundamentals of structure-property relationships in materials and the radiation sources suitable for materials characterization. The second part then focuses on such characterization techniques as diffraction and scattering methods, as well as direct imaging and tomography. The third part presents new and emerging methods of materials characterization in the field of 3D characterization techniques like three-dimensional X-ray diffraction microscopy. The fourth and final part is a collection of examples that demonstrate the application of the methods introduced in the first parts to problems in materials science. With thoroughly revised and updated chapters and now containing about 20% new material, this is the must-have, in-depth resource on this highly relevant topic.