Atomic Force Microscopy In Process Engineering
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Atomic Force Microscopy in Process Engineering
Author | : W. Richard Bowen,Nidal Hilal |
Publsiher | : Butterworth-Heinemann |
Total Pages | : 300 |
Release | : 2009-06-30 |
Genre | : Technology & Engineering |
ISBN | : 9780080949574 |
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This is the first book to bring together both the basic theory and proven process engineering practice of AFM. It is presented in a way that is accessible and valuable to practising engineers as well as to those who are improving their AFM skills and knowledge, and to researchers who are developing new products and solutions using AFM. The book takes a rigorous and practical approach that ensures it is directly applicable to process engineering problems. Fundamentals and techniques are concisely described, while specific benefits for process engineering are clearly defined and illustrated. Key content includes: particle-particle, and particle-bubble interactions; characterization of membrane surfaces; the development of fouling resistant membranes; nanoscale pharmaceutical analysis; nanoengineering for cellular sensing; polymers on surfaces; micro and nanoscale rheometry. Atomic force microscopy (AFM) is an important tool for process engineers and scientists as it enables improved processes and products The only book dealing with the theory and practical applications of atomic force microscopy in process engineering Provides best-practice guidance and experience on using AFM for process and product improvement
Electrical Atomic Force Microscopy for Nanoelectronics
Author | : Umberto Celano |
Publsiher | : Springer |
Total Pages | : 408 |
Release | : 2019-08-01 |
Genre | : Science |
ISBN | : 9783030156121 |
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The tremendous impact of electronic devices on our lives is the result of continuous improvements of the billions of nanoelectronic components inside integrated circuits (ICs). However, ultra-scaled semiconductor devices require nanometer control of the many parameters essential for their fabrication. Through the years, this created a strong alliance between microscopy techniques and IC manufacturing. This book reviews the latest progress in IC devices, with emphasis on the impact of electrical atomic force microscopy (AFM) techniques for their development. The operation principles of many techniques are introduced, and the associated metrology challenges described. Blending the expertise of industrial specialists and academic researchers, the chapters are dedicated to various AFM methods and their impact on the development of emerging nanoelectronic devices. The goal is to introduce the major electrical AFM methods, following the journey that has seen our lives changed by the advent of ubiquitous nanoelectronics devices, and has extended our capability to sense matter on a scale previously inaccessible.
Noncontact Atomic Force Microscopy
Author | : S. Morita,Roland Wiesendanger,E. Meyer |
Publsiher | : Springer Science & Business Media |
Total Pages | : 468 |
Release | : 2002-07-24 |
Genre | : Mathematics |
ISBN | : 3540431179 |
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Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues.
Atomic Force Microscopy
Author | : Peter Eaton,Paul West |
Publsiher | : Oxford University Press |
Total Pages | : 257 |
Release | : 2010-03-25 |
Genre | : Science |
ISBN | : 9780199570454 |
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Atomic force microscopes are very important tools for the advancement of science and technology. This book provides an introduction to the microscopes so that scientists and engineers can learn both how to use them, and what they can do.
Fundamentals of Atomic Force Microscopy
Author | : Ronald G. Reifenberger |
Publsiher | : World Scientific Publishing Company Incorporated |
Total Pages | : 350 |
Release | : 2015-02 |
Genre | : Science |
ISBN | : 9814630349 |
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The atomic force microscope (AFM) is a highly interdisciplinary instrument that enables measurements of samples in liquid, vacuum or air with unprecedented resolution. The intelligent use of this instrument requires knowledge from many distinct fields of study. These lecture notes aim to provide advanced undergraduates and beginning graduates in all fields of science and engineering with the required knowledge to sensibly use an AFM. Relevant background material is often reviewed in depth and summarized in a pedagogical, self-paced style to provide a fundamental understanding of the scientific principles underlying the use and operation of an AFM.
Atomic Force Microscopy Scanning Tunneling Microscopy 3
Author | : Samuel H. Cohen,Marcia L. Lightbody |
Publsiher | : Springer Science & Business Media |
Total Pages | : 210 |
Release | : 2007-05-08 |
Genre | : Technology & Engineering |
ISBN | : 9780306470950 |
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The Foundation for Advances in Medicine and Science (FAMS), the organizers of SCANNING 98, sponsored its third annual Atomic Force Microscopy/Scanning Tunneling Microscopy Symposium at the Omni Inner Harbor Hotelin Baltimore, Maryland, from May 9 to 12, 1998. This book represents the compilation of papers that were presented at the AFM/STM Symposium as well as a few that were presented at SCANNING 96 and SCANNING 97 meetings that took place in Monterey, California. The purpose of the symposium was to provide an interface between scientists and engineers, representatives of industry, government and academia, all of whom have a common interest in probe microscopies. The meetings offered an ideal forum where ideas could easily be exchanged and where individuals from diverse fields who are on the cutting edge ofprobe microscopy research could communicate with one another. Experts in probe microscopy from around the world representing a wide range of disciplines including physics, biotechnology, nanotechnology, chemistry, material science, etc., were invited to participate. The format of the meeting was structured so as to encourage communication among these individuals. During the first day’s sessions papers were presented on general topics such as application of scanning probe microscopy in materials science; STM and scanning tunneling spectroscopy of organic materials; fractal analysis in AFM; and nanomanipulation. Other papers presented included unexpected ordering of a molecule; synthesis ofpeptides and oligonucleotides; and analysis oflunar soils from Apollo 11.
Application of Nanotechnology in Membranes for Water Treatment
Author | : Alberto Figoli,Jan Hoinkis,Sacide Alsoy Altinkaya,Jochen Bundschuh |
Publsiher | : CRC Press |
Total Pages | : 306 |
Release | : 2017-07-14 |
Genre | : Science |
ISBN | : 9781351715263 |
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The book focuses on Application of Nanotechnology in Membranes for Water Treatment but not only provides a series of innovative solutions for water reclamation through advanced membrane technology but also serves as a medium to promote international cooperation and networking for the development of advanced membrane technology for Universal well-being and to achieve the common goal of supplying economically, environmentally and societally sustainable freshwater and better sanitation systems. This book is unique because the chapters were authored by established researchers all around the globe based on their recent research findings. In addition, this book provides a holistic coverage of membrane development for water treatment, from the membrane preparation and characterizations to the performance for specific processes and applications. Since that water scarcity has become a global risk and one of the most serious challenges for the scientific community in this century, the publication of this book is therefore significant as it will serve as a medium for a good reference of an alternative solution in water reclamation. This book will provide the readers with a thorough understanding of the different available approaches for manufacturing membranes both with innovative polymeric systems and inorganic nano-materials which could give enhanced functionalities, catalytic and antimicrobial activities to improve the performance of the existing membranes. It will be useful for leading decision and policy makers, water sector representatives and administrators, policy makers from the governments, business leaders, business houses in water treatment, and engineers/ scientists from both industrialized and developing countries as well.
Nonlinearity Bifurcation and Chaos
Author | : Jan Awrejcewicz,Peter Hagedorn |
Publsiher | : BoD – Books on Demand |
Total Pages | : 360 |
Release | : 2012-10-24 |
Genre | : Mathematics |
ISBN | : 9789535108160 |
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Nonlinearity, Bifurcation and Chaos - Theory and Application is an edited book focused on introducing both theoretical and application oriented approaches in science and engineering. It contains 12 chapters, and is recommended for university teachers, scientists, researchers, engineers, as well as graduate and post-graduate students either working or interested in the field of nonlinearity, bifurcation and chaos.