Body Probe

Accurate measurement at the nano-scale – nanometrology – is a critical tool for advanced nanotechnology applications, where exact quantities and engineering precision are beyond the capabilities of traditional measuring techniques and instruments. Scanning Probe Microscopy (SPM) builds up a picture of a specimen by scanning with a physical probe; unrestrained by the wavelength of light or electrons, the resolution obtainable with this technique can resolve atoms. SPM instruments include the Atomic Force Microscope (AFM) and Scanning Tunneling Microscope (STM). Despite tremendous advances in Scanning Probe Microscopy (SPM) over the last twenty years, its potential as a quantitative measurement tool have not been fully realized, due to challenges such as the complexity of tip/sample interaction. In this book, Petr Klapetek uses the latest research to unlock SPM as a toolkit for nanometrology in fields as diverse as nanotechnology, surface physics, materials engineering, thin film optics, and life sciences. Klapetek's considerable experience of Quantitive Data Processing, using software tools, enables him to not only explain the microscopy techniques, but also to demystify the analysis and interpretation of the data collected. In addition to the essential principles and theory of SPM metrology, Klapetek provides readers with a number of worked examples to demonstrate typical ways of solving problems in SPM analysis. Source data for the examples as well as most of the described open source software tools are available on a companion website. Unlocks the use of Scanning Probe Microscopy (SPM) for nanometrology applications in engineering, physics, life science and earth science settings. Provides practical guidance regarding areas of difficulty such as tip/sample interaction and calibration – making metrology applications achievable. Gives guidance on data collection and interpretation, including the use of software-based modeling (using applications that are mostly freely available).

Technology and the human body are becoming increasingly entwined. As we enter the new millennium, Body Probe provides a graphic, penetrative and confrontational insight into the work of leading international performance artists and designers.

Scanning Probe Microscopy - Analytical Methods provides a comprehensive overview of the analytical methods on the nanometer scale based on scanning probe microscopy and spectroscopy. Numerous examples of applications of the chemical contrast mechanism down to the atomic scale in surface physics and chemistry are discussed with extensive references to original work in the recent literature.

An investigation of the pressure-sensing characteristics of an error-compensated static-pressure probe mounted on the nose section of a missile body has been conducted in the Langley 16-foot transonic tunnel. The probe was free to rotate about its roll axis and was equipped with a vane so that the crossflow velocity component due to angles of attack of sideslip was always alined with the probe's vertical plane of symmetry. The probe was tested in five axial positions with respect to the missile nose at Mach numbers from 0.30 to 1.08 and at angles of attack from -2.7° to 15.3°. The test Reynolds number per foot varied from 1.79 x 106 to 4.05 x 106. Results showed that at a Mach number of 1.00 the static-pressure error decreased from 3.5 percent to 0.8 percent of the free-stream static pressure, as a result of a change in orifice location from 0.15 maximum missile diameter to 0.20 maximum missile diameter forward of the missile nose. Although compensation for pressure-sensing errors due to angles of attack up to 15.3 was maintained at Mach numbers from M = 0.30 to M = 0.50, there was an increase in error with an increase in angle of attack for Mach numbers between M = 0.50 and M = 1.08.