Characterization I

The present work addresses itself to the question of the nature of appraisive concepts such as were the subject of investigation in The Concepts of Value* and The Concepts of Criticism. ** Many problems of prime importance in the theory of value could not be adequately treated there without diminishing the basic purpose of those studies which was above all to identify, classify and provide a general theoretical framework for the host of concepts with which we characterize and commend subjects of appraisal in all of the principal areas of human interest. The author might have forestalled the disappointment of some of his critics had he then explicitly promised to consider those problems at a later time. But his reluctance to promise what he might not be in a position to produce outweighed a keen awareness of what the problems are and of their evident seriousness. Although my treatment of such problems has only now been undertaken, in point of time my concern with them antedates by far the em pirical explorations of the two texts mentioned. Anyone who undertakes such a study is likely to have come under the in fluence of Professor Frank Sibley's 'Aesthetic Concepts't and of later develop ments in his analysis of certain appraisive concepts. What do such concepts mean and how do they mean9 These are the questions he treated in such a stimulating fashion.

This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: Updated and revised figures and examples reflecting the most current data and information 260 new references offering access to the latest research and discussions in specialized topics New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.

Molecular Sieves - Science and Technology covers, in a comprehensive manner, the science and technology of zeolites and all related microporous and mesoporous materials. Authored by renowned experts, the contributions are grouped together topically in such a way that each volume of the book series deals with a specific sub-field. Volume 4 covers the characterization of molecular sieves with the help of the most important spectroscopic techniques (Characterization I), i.e. IR, Raman, NMR, EPR, UV-VIS Spectroscopy, X-ray absorption, photoelectron and Mössbauer Spectroscopy. Theory, experiment and application in selected examples are discussed.

Characterization of Nanoparticles: Measurement Processes for Nanoparticles surveys this fast growing field, including established methods for the physical and chemical characterization of nanoparticles. The book focuses on sample preparation issues (including potential pitfalls), with measurement procedures described in detail. In addition, the book explores data reduction, including the quantitative evaluation of the final result and its uncertainty of measurement. The results of published inter-laboratory comparisons are referred to, along with the availability of reference materials necessary for instrument calibration and method validation. The application of these methods are illustrated with practical examples on what is routine and what remains a challenge. In addition, this book summarizes promising methods still under development and analyzes the need for complementary methods to enhance the quality of nanoparticle characterization with solutions already in operation. Helps readers decide which nanocharacterization method is best for each measurement problem, including limitations, advantages and disadvantages Shows which nanocharacterization methods are best for different classes of nanomaterial Demonstrates the practical use of a method based on selected case studies

Fifteen papers from the symposium held in Philadelphia, March 1990, examine the uses of thermomechanical analysis and thermodilatometry in materials science, addressing instrumentation, techniques, and applications. Annotation copyright Book News, Inc. Portland, Or.

This 2-volume set includes extensive discussions of scattering techniques (light, neutron and X-ray) and related fluctuation and grating techniques that are at the forefront of this field. Most of the scattering techniques are Fourier space techniques. Recent advances have seen the development of powerful direct imaging methods such as atomic force microscopy and scanning probe microscopy. In addition, techniques that can be used to manipulate soft matter on the nanometer scale are also in rapid development. These include the scanning probe microscopy technique mentioned above as well as optical and magnetic tweezers.

Rapid and continued developments in electronics, optics, computing, instrumentation, spectroscopy, and other branches of science and technology resulted in considerable improvements in various methodologies. Due to this revolution in methodology, it is now possible to solve problems which were previously considered difficult to solve. These new methods have led to a better characterization and understanding of foods. The aim of this book is to assemble, for handy reference, various emerging, state-of-the-art methodologies used for characterizing foods. Although the emphasis is on real foods, model food systems are also considered. Methods pertaining to interfaces (food emulsions, foams, and dispersions), fluorescence, ultrasonics, nuclear magnetic resonance, electron spin resonance, Fourier-transform infrared and near infrared spectroscopy, small-angle neutron scattering, dielectrics, microscopy, rheology, sensors, antibodies, flavor and aroma analysis are included. This book is an indispensable reference source for scientists, engineers, and technologists in industries, universities, and government laboratories who are involved in food research and/or development, and also for faculty, advanced undergraduate, graduate and postgraduate students from Food Science, Food Engineering, and Biochemistry departments. In addition, it will serve as a valuable reference for analytical chemists and surface and colloid scientists.

With its focus on the characterization of nanocomposites using such techniques as x-ray diffraction and spectrometry, light and electron microscopy, thermogravimetric analysis, as well as nuclear magnetic resonance and mass spectroscopy, this book helps to correctly interpret the recorded data. Each chapter introduces a particular characterization method, along with its foundations, and makes the user aware of its benefits, but also of its drawbacks. As a result, the reader will be able to reliably predict the microstructure of the synthesized polymer nanocomposite and its thermal and mechanical properties, and so assess its suitability for a particular application. Belongs on the shelf of every product engineer.