Defecting In Place

This extremely valuable study containing many quotations and data from a survey of more than 7,000 women, documents the growing grassroots nature of feminist spirituality.

Why do certain militaries brutally suppress popular demonstrations, while others support the path to political liberalization by backing mass social movements? Although social movements and media can help destabilize authoritarian governments, not all social protest is effective or culminates in the toppling of dictatorships. Frequently, the military’s response determines the outcome. In Defect or Defend, Terence Lee uses four case studies from Asia to provide insight into the military’s role during the transitional phase of regime change. Lee compares popular uprisings in the Philippines and Indonesia—both of which successfully engaged military support to bring down authoritarian rule—with protest movements in China and Burma which were violently suppressed by military forces. Lee’s theory of “high personalism” and power-sharing among the armed forces leadership provides a framework for understanding the critical transitory phases of democratization. He uses this theory to review and assess Eastern Europe’s democratization events in 1989, the Colored Revolutions of the early 2000s, and the protests and revolutions unfolding in the Middle East. This book will appeal to students and scholars of comparative politics, Asian studies, security studies, and international relations, as well as defense policymakers.

Telekinesis? No problem. Trying to stay alive? Problem. Big problem. It has been sixty-five years since the Genetic War, but the Defects and the Pures are still at odds. The Pure government is on the hunt for the remaining Defects, and no one is safe. With government patrols on the rise in what was once known as Minneapolis, eighteen-year-old Lyla Paxton struggles to find her place in the decrepit world with empty memories about her past. When a visit from a mysterious stranger claims that Ly

The history of this book begins way back in 1982. At that time a research proposal was filed with the Dutch Foundation for Fundamental Research on Matter concerning research to model defects in the layer structure of integrated circuits. It was projected that the results may be useful for yield estimates, fault statistics and for the design of fault tolerant structures. The reviewers were not in favor of this proposal and it disappeared in the drawers. Shortly afterwards some microelectronics industries realized that their survival may depend on a better integration between technology-and design-laboratories. For years the "silicon foundry" concept had suggested a fairly rigorous separation between the two areas. The expectation was that many small design companies would share the investment into the extremely costful Silicon fabrication plants while designing large lots of application-specific integrated circuits (ASIC's). Those fabrication plants would be concentrated with only a few market leaders.

This book explores the initial stage of the origin of the defect taking into account technical, biological, and other features of several technologies. These technologies allow the defect monitoring at the beginning of the defect origin to be performed at the expense of extracting information from the noise. This book appeals to a wide audience focused on solving numerous problems.

This book contains an edited selection of papers presented at the International Workshop on Defect and Fault Tolerance in VLSI Systems held October 6-7, 1988 in Springfield, Massachusetts. Our thanks go to all the contributors and especially the members of the program committee for the difficult and time-consuming work involved in selecting the papers that were presented in the workshop and reviewing the papers included in this book. Thanks are also due to the IEEE Computer Society (in particular, the Technical Committee on Fault-Tolerant Computing and the Technical Committee on VLSI) and the University of Massachusetts at Amherst for sponsoring the workshop, and to the National Science Foundation for supporting (under grant number MIP-8803418) the keynote address and the distribution of this book to all workshop attendees. The objective of the workshop was to bring t. ogether researchers and practition ers from both industry and academia in the field of defect tolerance and yield en ha. ncement in VLSI to discuss their mutual interests in defect-tolerant architectures and models for integrated circuit defects, faults, and yield. Progress in this area was slowed down by the proprietary nature of yield-related data, and by the lack of appropriate forums for disseminating such information. The goal of this workshop was therefore to provide a forum for a dialogue and exchange of views. A follow-up workshop in October 1989, with C. H. Stapper from IBM and V. K. Jain from the University of South Florida as general co-chairmen, is being organized.

Maximizing reader insights into the use of thermography, specifically pulsed and pulse phase thermography (PT and PPT), for the identification of kissing defects in adhesive bonds, this thesis focuses on the application of PT and PPT for the identification of a range of defect types in a variety of materials to establish the effect of material properties on identification of defects. Featuring analysis of a numerical model developed to simulate the thermal evolution created during a PT or PPT experiment, after validation through a series of case studies, this model is then used as a predictive tool to relate defect detectability to the thermal property contrast between defect and bulk materials. Demonstrating a means of producing realistic kissing defects in bonded joints where insufficient thermal property contrast exists defects have a limited effect on heat propagation through a component and therefore are not detected using PT or PPT, this thesis discusses the addition of a small load to bonds containing kissing defects which was found to open the defects sufficiently to enable their detection. A low cost infrared detector, Flir Tau320, is compared to the research based photon detector, Flir SC5000, and is shown to be suitable for application in PT, thus enabling a significantly lower cost tool to be developed.