Handbook Of X Ray Spectrometry Second Edition

This work updates applications of all modes of x-ray spectrometry, including total reflection and polarized beam x-ray fluorescence analysis, and synchrotron radiation induced x-ray emission. It promotes the measurement of samples while reducing the scattered background in the x-ray spectrum.

"Updates fundamentals and applications of all modes of x-ray spectrometry, including total reflection and polarized beam x-ray fluorescence analysis, and synchrotron radiation induced x-ray emission. Promotes the accurate measurement of samples while reducing the scattered background in the x-ray spectrum."

Provides coverage of all aspects of X-ray spectrometry, including thorough treatments of each X-ray emission analysis technique. The book brings together in-depth discussions of radioisotope X-ray analysis, synchrotron radiation-induced X-ray emission, total reflection X-ray fluorescence analysis and polarized beam X-ray fluorescence analysis. environmental chemists and biochemists, applied physicists, biologists, geologists, metallurgists, and upper-level undergraduate and graduate students in these disciplines.

"Updates fundamentals and applications of all modes of x-ray spectrometry, including total reflection and polarized beam x-ray fluorescence analysis, and synchrotron radiation induced x-ray emission. Promotes the accurate measurement of samples while reducing the scattered background in the x-ray spectrum."

X-Ray fluorescence analysis is an established technique for non-destructive elemental materials analysis. This book gives a user-oriented practical guidance to the application of this method. The book gives a survey of the theoretical fundamentals, analytical instrumentation, software for data processing, various excitation regimes including gracing incidents and microfocus measurements, quantitative analysis, applications in routine and micro analysis, mineralogy, biology, medicine, criminal investigations, archeology, metallurgy, abrasion, microelectronics, environmental air and water analysis. This book is the bible of X-Ray fluorescence analysis. It gives the basic knowledge on this technique, information on analytical equipment and guides the reader to the various applications. It appeals to researchers, analytically active engineers and advanced students.

This work covers important aspects of X-ray spectrometry, from basic principles to the selection of instrument parameters and sample preparation. This edition explicates the use of combined X-ray fluorescence and X-ray diffraction data, and features new applications in environmental studies, forensic science, archeometry and the analysis of metals and alloys, minerals and ore, ceramic materials, catalysts and trace metals.;This work is intended for spectroscopists, analytical chemists, materials scientists, experimental physicists, mineralogists, biologists, geologists and graduate-level students in these disciplines.

With contributions from over 40 experts in the field, this reference presents comprehensive, single-source coverage of the instrumentation, computerization, calibration, and methods development of NIR spectroscopy. It provides novel applications for accurate time- and cost-effective analyses of pharmaceuticals, polymers, textiles, agricultural products, dairy products, foods, and beverages. Emphasizing trends in sample preparation, the book covers historical development, calibration transfer, biomedical applications, plastics, and counterfeiting; on-line, in-line, and at-line analyses for process control, multilinear regression and principal component analysis, and more.

X-Ray Fluorescence Spectrometry, Ron Jenkins Written by the principal scientist for JCPDS, the International Centre for Diffraction Data, Swarthmore, Pennsylvania, this book focuses on the scientific and technological developments achieved in the field during the past decade. It offers comprehensive coverage of all crucial topics, including: the properties and uses of X-ray emission spectrometry in material analysis; its industrial applications; X-ray diffraction; instrumentation for X-ray fluorescence spectrometry; a comparison of wavelength and energy dispersive spectrometers; and use of X-ray spectrometry for qualitative analysis.