Introduction To Subsurface Imaging

Describes and evaluates the basic principles, methods and applications of subsurface sensing and imaging, covering a wide range of techniques.

Describing and evaluating the basic principles and methods of subsurface sensing and imaging, Introduction to Subsurface Imaging is a clear and comprehensive treatment that links theory to a wide range of real-world applications in medicine, biology, security and geophysical/environmental exploration. It integrates the different sensing techniques (acoustic, electric, electromagnetic, optical, x-ray or particle beams) by unifying the underlying physical and mathematical similarities, and computational and algorithmic methods. Time-domain, spectral and multisensor methods are also covered, whilst all the necessary mathematical, statistical and linear systems tools are given in useful appendices to make the book self-contained. Featuring a logical blend of theory and applications, a wealth of color illustrations, homework problems and numerous case studies, this is suitable for use as both a course text and as a professional reference.

Describing and evaluating the basic principles and methods of subsurface sensing and imaging, Introduction to Subsurface Imaging is a clear and comprehensive treatment that links theory to a wide range of real-world applications in medicine, biology, security and geophysical/environmental exploration. It integrates the different sensing techniques (acoustic, electric, electromagnetic, optical, x-ray or particle beams) by unifying the underlying physical and mathematical similarities, and computational and algorithmic methods. Time-domain, spectral and multisensor methods are also covered, whilst all the necessary mathematical, statistical and linear systems tools are given in useful appendices to make the book self-contained. Featuring a logical blend of theory and applications, a wealth of color illustrations, homework problems and numerous case studies, this is suitable for use as both a course text and as a professional reference.

Written for practicing geophysicists, “Land Seismic Case Studies for Near-Surface Modeling and Subsurface Imaging” is a comprehensive guide to understanding and interpreting seismic data. The culmination of land seismic data acquisition and processing projects conducted by the author over the last two decades, this book contains more than nearly 800 figures from worldwide case studies—conducted in both 2D and 3D. Beginning with Chapter 1 on seismic characterization of the near-surface, Chapter 2 presents near-surface modeling by traveltime and full-wave inversion, Chapter 3 presents near-surface modeling by imaging, and then Chapter 4 includes detailed case studies for near-surface modeling. Chapter 5 reviews single- and multichannel signal processing of land seismic data with the key objective of removing surface waves and guided waves that are characterized as coherent linear noise. Uncommon seismic data acquisition methods, including large-offset acquisition in thrust belts to capture the large-amplitude supercritical reflections, swath-line acquisition, and joint PP and SH- SH seismic imaging are highlighted in Chapter 6, and Chapter 7 presents image-based rms velocity estimation and discusses the problem of velocity uncertainty. The final two chapters focus exclusively on case studies: 2D in Chapter 8 and 3D in Chapter 9. An outstanding teaching tool, this book includes analysis workflows containing processing steps designed to solve specific problems. Essential for anyone involved in acquisition, processing, and inversion of seismic data, this volume will become the definitive reference for understanding how the variables in seismic acquisition are directly reflected in the data.

This edition of Introduction to Applied Geophysics from Cambridge University Press is a re-issue of the W.W. Norton edition (2006). This classic textbook covers the fundamental methods of exploration geophysics in a depth and style both challenging and appropriate to undergraduates, and is supported by an extensive package of software.

Interpreting Subsurface Seismic Data presents recent advances in methodologies for seismic imaging and interpretation across multiple applications in geophysics including exploration, marine geology, and hazards. It provides foundational information for context, as well as focussing on recent advances and future challenges. It offers detailed methodologies for interpreting the increasingly vast quantity of data extracted from seismic volumes. Organized into three parts covering foundational context, case studies, and future considerations, Interpreting Subsurface Seismic Data offers a holistic view of seismic data interpretation to ensure understanding while also applying cutting-edge technologies. This view makes the book valuable to researchers and students in a variety of geoscience disciplines, including geophysics, hydrocarbon exploration, applied geology, and hazards. Presents advanced seismic detection workflows utilized cutting-edge technologies Integrates geophysics and geology for a variety of applications, using detailed examples Provides an overview of recent advances in methodologies related to seismic imaging and interpretation

Regional Geology and Tectonics: Principles of Geologic Analysis, 2nd edition is the first in a three-volume series covering Phanerozoic regional geology and tectonics. The new edition provides updates to the first edition’s detailed overview of geologic processes, and includes new sections on plate tectonics, petroleum systems, and new methods of geological analysis. This book provides both professionals and students with the basic principles necessary to grasp the conceptual approaches to hydrocarbon exploration in a wide variety of geological settings globally. Discusses in detail the principles of regional geological analysis and the main geological and geophysical tools Captures and identifies the tectonics of the world in detail, through a series of unique geographic maps, allowing quick access to exact tectonic locations Serves as the ideal introductory overview and complementary reference to the core concepts of regional geology and tectonics offered in volumes 2 and 3 in the series

This volume focuses on a variety of novel non-destructive techniques for the characterization of materials, processes and devices. Emphasis is placed on probe-specimen interactions, in-situ diagnosis, instrumentation developments and future trends. This was the first time a symposium on this topic had been held, making the response particularly gratifying. The high quality of the contributions are a clear indication that non-destructive materials characterization is becoming a dynamic research area in Europe at the present time.A selection of contents: The role of acoustic properties in designs of acoustic and optical fibers (C.K. Jen). Observation of stable crack growth in Al2O3 ceramics using a scanning acoustic microscope (A. Quinten, W. Arnold). Mechanical characterization by acoustic techniques of SIC chemical vapour deposited thin films (J.M. Saurel et al.). Efficient generation of acoustic pressure waves by short laser pulses (S. Fassbender et al.). Use of scanning electron acoustic microscopy for the analysis of III-V compound devices (J.F. Bresse). Waves and vibrations in periodic piezoelectric composite materials (B.A. Auld). Precision ultrasonic velocity measurements for the study of the low temperature acoustic properties in defective materials (A. Vanelstraete, C. Laermans). Thermally induced concentration wave imaging (P. Korpiun et al.). Interferometric measurement of thermal expansion (V. Kurzmann et al.). Quantitative analyses of power loss mechanisms in semiconductor devices by thermal wave calorimetry (B. Büchner et al.). Thermal wave probing of the optical electronic and thermal properties of semiconductors (D. Fournier, A. Boccara). Thermal wave measurements in ion-implanted silicon (G. Queirola et al.). Optical-thermal non-destructive examination of surface coatings (R.E. Imhof et al.). Bonding analysis of layered materials by photothermal radiometry (M. Heuret et al.). Thermal non-linearities of semiconductor-doped glasses in the near-IR region (M. Bertolotti et al.). Theory of picosecond transient reflectance measurement of thermal and eisatic properties of thin metal films (Z. Bozóki et al.). The theory and application of contactless microwave lifetime measurement (T. Otaredian et al.). Ballistic phonon signal for imaging crystal properties (R.P. Huebener et al.). Determination of the elastic constants of a polymeric Langmuir-Blodgett film by Briliouin spectroscopy (F. Nizzoli et al.). Quantum interference effects in the optical second-harmonic response tensor of a metal surface (O. Keller). Study of bulk and surface phonons and plasmons in GaAs/A1As superlattices by far-IR and Raman spectroscopy (T. Dumslow et al.). Far-IR spectroscopy of bulk and surface phonon-polaritons on epitaxial layers of CdTe deposited by plasma MOCVD on GaAs substrates (T. Dumelow et al.). In-situ characterization by reflectance difference spectroscopy of III-V materials and heterojunctions grown by low pressure metal organic chemical vapour deposition (O. Acher et al.). Optical evidence of precipitates in arsenic-implanted silicon (A. Borghesi et al.). Polarized IR reflectivity of CdGeAs2 (L. Artús et al.). Raman and IR spectroscopies: a useful combination to study semiconductor interfaces (D.R.T. Zahn et al.). Silicon implantation of GaAs at low and medium doses: Raman assessment of the dopant activation (S. Zakang et al.). Ellipsometric characterization of thin films and superlattices (J. Bremer et al.). Ellipsometric characterization of multilayer transistor structures (J.A. Woollam et al.). Quality of molecular-beam-epitaxy-grown GaAs on Si(100) studied by ellipsometry (U. Rossow et al.). An ellipsometric and RBS study of TiSi2 formation (J.M.M. de Nijs, A. van Silfhout). A new microscope for semiconductor luminescence studies (P.S. Aplin, J.C. Day). Structural analysis of optical fibre preforms fabricated by the sol-gel process (A.M. Elas et al.). Author index.