Istfa 2019 Proceedings Of The 45th International Symposium For Testing And Failure Analysis
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ISTFA 2019 Proceedings of the 45th International Symposium for Testing and Failure Analysis
Author | : Anonim |
Publsiher | : ASM International |
Total Pages | : 540 |
Release | : 2019-12-01 |
Genre | : Technology & Engineering |
ISBN | : 9781627082730 |
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The theme for the 2019 conference is Novel Computing Architectures. Papers will include discussions on the advent of Artificial Intelligence and the promise of quantum computing that are driving disruptive computing architectures; Neuromorphic chip designs on one hand, and Quantum Bits on the other, still in R&D, will introduce new computing circuitry and memory elements, novel materials, and different test methodologies. These novel computing architectures will require further innovation which is best achieved through a collaborative Failure Analysis community composed of chip manufacturers, tool vendors, and universities.
ISTFA 2017 Proceedings from the 43rd International Symposium for Testing and Failure Analysis
Author | : Anonim |
Publsiher | : ASM International |
Total Pages | : 135 |
Release | : 2017-12-01 |
Genre | : Technology & Engineering |
ISBN | : 9781627081511 |
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The theme for the November 2017 conference was Striving for 100% Success Rate. Papers focus on the tools and techniques needed for maximizing the success rate in every aspect of the electronic device failure analysis process.
Physical Assurance
Author | : Navid Asadizanjani,Mir Tanjidur Rahman,Mark Tehranipoor |
Publsiher | : Springer Nature |
Total Pages | : 193 |
Release | : 2021-02-15 |
Genre | : Technology & Engineering |
ISBN | : 9783030626099 |
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This book provides readers with a comprehensive introduction to physical inspection-based approaches for electronics security. The authors explain the principles of physical inspection techniques including invasive, non-invasive and semi-invasive approaches and how they can be used for hardware assurance, from IC to PCB level. Coverage includes a wide variety of topics, from failure analysis and imaging, to testing, machine learning and automation, reverse engineering and attacks, and countermeasures.
Proceedings
Author | : Anonim |
Publsiher | : Unknown |
Total Pages | : 556 |
Release | : 2005 |
Genre | : Electronic apparatus and appliances |
ISBN | : UOM:39015062539302 |
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ISTFA 2010
Author | : Anonim |
Publsiher | : ASM International |
Total Pages | : 487 |
Release | : 2010-01-01 |
Genre | : Technology & Engineering |
ISBN | : 9781615037278 |
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ISTFA 2021
![ISTFA 2021](https://youbookinc.com/wp-content/uploads/2024/06/cover.jpg)
Author | : ASM INTERNATIONAL. |
Publsiher | : Unknown |
Total Pages | : 135 |
Release | : 2022 |
Genre | : Electronic Book |
ISBN | : 1627084193 |
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ISTFA 2009
Author | : Anonim |
Publsiher | : ASM International |
Total Pages | : 371 |
Release | : 2009-01-01 |
Genre | : Technology & Engineering |
ISBN | : 9781615030927 |
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This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures. Case histories and review papers are included, as well as guides to new and unique tools and methodologies, applications and results.
Istfa 2005
Author | : ASM International |
Publsiher | : ASM International |
Total Pages | : 524 |
Release | : 2005-01-01 |
Genre | : Technology & Engineering |
ISBN | : 9781615030880 |
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