Measurement Of Pulsed Laser Power Classic Reprint

Excerpt from Measurement of Pulsed-Laser Power We describe calibrating several Optical-pulse power meters to an accuracy of about 82 or better. The meters are designed for Q-switched neodymium lasers with peak powers in excess of a few megawatts and pulses longer than five or ten nanoseconds. Combined with a fast oscilloscope or a transient digitizer, the meters display the time-domain waveform of the laser emission and thereby allow determination of Parameters such as transition duration (risetime, falltime), duration and peak power. We discuss calibrating the meters by both pulsed and cw methods, and show why each method is useful as a check on the other. We treat in some detail the effect of speckle on the use of diffusers as attenuators in power-meters such as ours. About the Publisher Forgotten Books publishes hundreds of thousands of rare and classic books. Find more at www.forgottenbooks.com This book is a reproduction of an important historical work. Forgotten Books uses state-of-the-art technology to digitally reconstruct the work, preserving the original format whilst repairing imperfections present in the aged copy. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in our edition. We do, however, repair the vast majority of imperfections successfully; any imperfections that remain are intentionally left to preserve the state of such historical works.

Excerpt from Calibration Service for Laser Power and Energy at 248 Nm The rapid growth in the commercial application of excimer lasers has resulted in a compelling need for corresponding nist standards and measurement services. Excimer lasers are now being used in semiconductor photolithography, medical procedures, and a variety of materials-processing applications. About the Publisher Forgotten Books publishes hundreds of thousands of rare and classic books. Find more at www.forgottenbooks.com This book is a reproduction of an important historical work. Forgotten Books uses state-of-the-art technology to digitally reconstruct the work, preserving the original format whilst repairing imperfections present in the aged copy. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in our edition. We do, however, repair the vast majority of imperfections successfully; any imperfections that remain are intentionally left to preserve the state of such historical works.

High Speed Pulse Technology: Volume II: Optical Pulses - Lasers - Measuring Techniques focuses on the theoretical and engineering problems that result from the capacitor discharge technique. This book is organized into three main topics: light flash production from a capacitive energy storage; signal transmission and ranging systems by capacitor discharges and lasers; and impulse measuring technique. This text specifically discusses the air spark under atmospheric conditions, industrial equipment for laser flashing, and claims for light transmitting system. The application of light impulse signal transmission, impulse measurements by means of spark gaps, and conversion factors of various energy units are also described. This publication is recommended for eager electrical engineering and physics students interested in optical pulses, lasers, and measuring techniques.

Excerpt from Measurement of Electrical Quantities in Pulse Power Systems: Proceedings of the Workshop on Measurement of Electrical Quantities in Pulse Power Systems Held at the National Bureau of Standards, Boulder, Colorado, March 2-4, 1981 Key words: current measurements; electrical measurements; electromagnetic pulse; fusion; nuclear effects simulation; particle beam technology. About the Publisher Forgotten Books publishes hundreds of thousands of rare and classic books. Find more at www.forgottenbooks.com This book is a reproduction of an important historical work. Forgotten Books uses state-of-the-art technology to digitally reconstruct the work, preserving the original format whilst repairing imperfections present in the aged copy. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in our edition. We do, however, repair the vast majority of imperfections successfully; any imperfections that remain are intentionally left to preserve the state of such historical works.

This book documents the proceedings of the Second International Symposium on Adhesion Measurement of Films and Coatings, held in Newark, NJ, October 25-27, 1999. Since the First Symposium (Boston 1992) there had been considerable activity in devising new, more reliable and more efficient ways to measure adhesion of films and coatings, which resulted in the decision to organize the Newark Symposium.Films and coatings are used for a variety of purposes – functional, decorative, protective, etc. – in a host of applications. Irrespective of the purpose or application of a film or a coating, their adequate adhesion to the underlying substrates is of paramount importance. Concomitantly, the need to develop techniques for quantitative assessment of adhesion of films and coatings is all too obvious.This volume contains a total of 20 papers, which have all been rigorously peer reviewed and suitably modified before inclusion. The topics include: measurement and analysis of interface adhesion; relative adhesion measurement for thin film structures; adhesion testing of hard coatings by a variety of techniques; challenges and new directions in scratch adhesion testing of coated substrates; application of scratch test to different films and coatings; evaluation of coating-substrate adhesion by indentation experiments; measurement of interfacial fracture energy in multifilm applications; laser induced decohesion spectroscopy (LIDS) for measuring adhesion; pulsed laser technique for assessment of adhesion; blade adhesion test; JKR adhesion test; coefficient of thermal expansion measurement; and residual stresses in diamond films.This volume, providing the latest information, will be of great value and interest to anyone working in the area of adhesion measurement of films and coatings.

Excerpt from Precision Measurement and Calibration: Selected Nbs Papers on Electricity-Radio Frequency Methods for measuring voltage, current, pulse power, power in millimeter-wave and laser-frequency regions, and swept-frequency techniques are discussed elsewhere in this issue of the proceedings, and will not be repeated here. About the Publisher Forgotten Books publishes hundreds of thousands of rare and classic books. Find more at www.forgottenbooks.com This book is a reproduction of an important historical work. Forgotten Books uses state-of-the-art technology to digitally reconstruct the work, preserving the original format whilst repairing imperfections present in the aged copy. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in our edition. We do, however, repair the vast majority of imperfections successfully; any imperfections that remain are intentionally left to preserve the state of such historical works.

Excerpt from Precision Spectroscopy, Diode Lasers, and Optical Frequency Measurement Technology: Selected Publications of the Optical Frequency Measurement Group of the Time and Frequency Division Older publications may be purchased from the National Technical Information Service whose website is or phone: 703-487-4650. About the Publisher Forgotten Books publishes hundreds of thousands of rare and classic books. Find more at www.forgottenbooks.com This book is a reproduction of an important historical work. Forgotten Books uses state-of-the-art technology to digitally reconstruct the work, preserving the original format whilst repairing imperfections present in the aged copy. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in our edition. We do, however, repair the vast majority of imperfections successfully; any imperfections that remain are intentionally left to preserve the state of such historical works.