Microelectronics Failure Analysis

Microelectronics Failure Analysis
Author: EDFAS Desk Reference Committee
Publsiher: ASM International
Total Pages: 673
Release: 2011
Genre: Technology & Engineering
ISBN: 9781615037261

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Includes bibliographical references and index.

Microelectronics Fialure Analysis Desk Reference Seventh Edition

Microelectronics Fialure Analysis Desk Reference  Seventh Edition
Author: Tejinder Gandhi
Publsiher: ASM International
Total Pages: 750
Release: 2019-11-01
Genre: Technology & Engineering
ISBN: 9781627082464

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The Electronic Device Failure Analysis Society proudly announces the Seventh Edition of the Microelectronics Failure Analysis Desk Reference, published by ASM International. The new edition will help engineers improve their ability to verify, isolate, uncover, and identify the root cause of failures. Prepared by a team of experts, this updated reference offers the latest information on advanced failure analysis tools and techniques, illustrated with numerous real-life examples. This book is geared to practicing engineers and for studies in the major area of power plant engineering. For non-metallurgists, a chapter has been devoted to the basics of material science, metallurgy of steels, heat treatment, and structure-property correlation. A chapter on materials for boiler tubes covers composition and application of different grades of steels and high temperature alloys currently in use as boiler tubes and future materials to be used in supercritical, ultra-supercritical and advanced ultra-supercritical thermal power plants. A comprehensive discussion on different mechanisms of boiler tube failure is the heart of the book. Additional chapters detailing the role of advanced material characterization techniques in failure investigation and the role of water chemistry in tube failures are key contributions to the book.

Microelectronic Failure Analysis

Microelectronic Failure Analysis
Author: Anonim
Publsiher: ASM International
Total Pages: 160
Release: 2002-01-01
Genre: Technology & Engineering
ISBN: 9780871707697

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Provides new or expanded coverage on the latest techniques for microelectronic failure analysis. The CD-ROM includes the complete content of the book in fully searchable Adobe Acrobat format. Developed by the Electronic Device Failure Analysis Society (EDFAS) Publications Committee

Microelectronic Failure Analysis

Microelectronic Failure Analysis
Author: Richard J. Ross,Christian Boit,Donald Staab
Publsiher: ASM International(OH)
Total Pages: 664
Release: 1999
Genre: Education
ISBN: UOM:39015055923034

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Forty-seven papers on electronics failure analysis provide an overview for newcomers to the field and a reference tool for the experienced analyst. Topics include electron/ion bean-based techniques, deprocessing and sample preparation, and physical/chemical defect characterization. For the fourth ed

Microelectronic Failure Analysis Desk Reference

Microelectronic Failure Analysis Desk Reference
Author: Anonim
Publsiher: ASM International
Total Pages: 162
Release: 2001-01-01
Genre: Technology & Engineering
ISBN: 9780871707451

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Developed by the Electronic Device Failure Analysis Society (EDFAS) Publications Committee.

Microelectronic Failure Analysis

Microelectronic Failure Analysis
Author: Thomas W. Lee,Seshu V. Pabbisetty
Publsiher: Asm International
Total Pages: 404
Release: 1993
Genre: Technology & Engineering
ISBN: 087170479X

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A compact compendium of information and techniques designed to address many of the varied subjects of concern to failure analysis. The volume is divided into sections devoted to failure analysis procedures and overview, electrical and mechanical characterization, specimen preparation, metallurgical

Microelectronics Failure Analysis

Microelectronics Failure Analysis
Author: Anonim
Publsiher: ASM International
Total Pages: 813
Release: 2004-01-01
Genre: Technology & Engineering
ISBN: 9780871708045

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For newcomers cast into the waters to sink or swim as well as seasoned professionals who want authoritative guidance desk-side, this hefty volume updates the previous (1999) edition. It contains the work of expert contributors who rallied to the job in response to a committee's call for help (the committee was assigned to the update by the Electron

Physics of Failure Based Handbook of Microelectronic Systems

Physics of Failure Based Handbook of Microelectronic Systems
Author: Shahrzad Salemi
Publsiher: RIAC
Total Pages: 271
Release: 2008
Genre: Electronic apparatus and appliances
ISBN: 9781933904290

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