On line Error Detection and Fast Recover Techniques for Dependable Embedded Processors

On line Error Detection and Fast Recover Techniques for Dependable Embedded Processors
Author: Matthias Pflanz
Publsiher: Springer
Total Pages: 132
Release: 2003-07-31
Genre: Computers
ISBN: 9783540458586

Download On line Error Detection and Fast Recover Techniques for Dependable Embedded Processors Book in PDF, Epub and Kindle

This book presents a new approach to on-line observation and concurrent checking of processors by refining and improving known techniques and introducing new ideas.The proposed on-line error detection and fast recover techniques support and complement other established methods. In combination with other on-line observation priniciples and with a combined hardware-software test, these techniques are used to fulfill a complete self-check scheme for an embedded processor.

Reliability Risk and Safety Three Volume Set

Reliability  Risk  and Safety  Three Volume Set
Author: Radim Bris,Carlos Guedes Soares,Sebastián Martorell
Publsiher: CRC Press
Total Pages: 2480
Release: 2009-08-20
Genre: Technology & Engineering
ISBN: 9780203859759

Download Reliability Risk and Safety Three Volume Set Book in PDF, Epub and Kindle

Containing papers presented at the 18th European Safety and Reliability Conference (Esrel 2009) in Prague, Czech Republic, September 2009, Reliability, Risk and Safety Theory and Applications will be of interest for academics and professionals working in a wide range of industrial and governmental sectors, including Aeronautics and Aerospace, Aut

Architecting Dependable Systems III

Architecting Dependable Systems III
Author: Rogério de Lemos,Cristina Gacek
Publsiher: Springer Science & Business Media
Total Pages: 357
Release: 2005-09-15
Genre: Computers
ISBN: 9783540289685

Download Architecting Dependable Systems III Book in PDF, Epub and Kindle

As software systems become ubiquitous, the issues of dependability become more and more crucial. Given that solutions to these issues must be considered from the very beginning of the design process, it is reasonable that dependability is addressed at the architectural level. This book comes as a result of an effort to bring together the research communities of software architectures and dependability. This state-of-the-art survey contains 16 carefully selected papers originating from the Twin Workshops on Architecting Dependable Systems (WADS 2004) accomplished as part of the International Conference on Software Engineering (ICSE 2004) in Edinburgh, UK and of the International Conference on Dependable Systems and Networks (DSN 2004) in Florence, Italy. The papers are organised in topical sections on architectures for dependable services, monitoring and reconfiguration in software architectures, dependability support for software architectures, architectural evaluation, and architectural abstractions for dependability.

Reliability of Nanoscale Circuits and Systems

Reliability of Nanoscale Circuits and Systems
Author: Miloš Stanisavljević,Alexandre Schmid,Yusuf Leblebici
Publsiher: Springer Science & Business Media
Total Pages: 215
Release: 2010-10-20
Genre: Technology & Engineering
ISBN: 9781441962171

Download Reliability of Nanoscale Circuits and Systems Book in PDF, Epub and Kindle

This book is intended to give a general overview of reliability, faults, fault models, nanotechnology, nanodevices, fault-tolerant architectures and reliability evaluation techniques. Additionally, the book provides an in depth state-of-the-art research results and methods for fault tolerance as well as the methodology for designing fault-tolerant systems out of highly unreliable components.

On Line Testing Symposium 2003 IOLTS 2003 9th IEEE

On Line Testing Symposium  2003  IOLTS 2003  9th IEEE
Author: C. Metra
Publsiher: Institute of Electrical & Electronics Engineers(IEEE)
Total Pages: 229
Release: 2003
Genre: Electronic circuit design
ISBN: 0769519687

Download On Line Testing Symposium 2003 IOLTS 2003 9th IEEE Book in PDF, Epub and Kindle

Proceedings

Proceedings
Author: Anonim
Publsiher: Unknown
Total Pages: 298
Release: 2002
Genre: Electronic circuit design
ISBN: UIUC:30112061450190

Download Proceedings Book in PDF, Epub and Kindle

American Book Publishing Record

American Book Publishing Record
Author: Anonim
Publsiher: Unknown
Total Pages: 2068
Release: 2002
Genre: Books
ISBN: STANFORD:36105111052911

Download American Book Publishing Record Book in PDF, Epub and Kindle

Design of Dependable Computing Systems

Design of Dependable Computing Systems
Author: J.C. Geffroy,G. Motet
Publsiher: Springer Science & Business Media
Total Pages: 678
Release: 2013-03-09
Genre: Computers
ISBN: 9789401598842

Download Design of Dependable Computing Systems Book in PDF, Epub and Kindle

This book analyzes the causes of failures in computing systems, their consequences, as weIl as the existing solutions to manage them. The domain is tackled in a progressive and educational manner with two objectives: 1. The mastering of the basics of dependability domain at system level, that is to say independently ofthe technology used (hardware or software) and of the domain of application. 2. The understanding of the fundamental techniques available to prevent, to remove, to tolerate, and to forecast faults in hardware and software technologies. The first objective leads to the presentation of the general problem, the fault models and degradation mechanisms wh ich are at the origin of the failures, and finally the methods and techniques which permit the faults to be prevented, removed or tolerated. This study concerns logical systems in general, independently of the hardware and software technologies put in place. This knowledge is indispensable for two reasons: • A large part of a product' s development is independent of the technological means (expression of requirements, specification and most of the design stage). Very often, the development team does not possess this basic knowledge; hence, the dependability requirements are considered uniquely during the technological implementation. Such an approach is expensive and inefficient. Indeed, the removal of a preliminary design fault can be very difficult (if possible) if this fault is detected during the product's final testing.