Optical Measurement Of Surface Topography

The measurement and characterisation of surface topography is crucial to modern manufacturing industry. The control of areal surface structure allows a manufacturer to radically alter the functionality of a part. Examples include structuring to effect fluidics, optics, tribology, aerodynamics and biology. To control such manufacturing methods requires measurement strategies. There is now a large range of new optical techniques on the market, or being developed in academia, that can measure areal surface topography. Each method has its strong points and limitations. The book starts with introductory chapters on optical instruments, their common language, generic features and limitations, and their calibration. Each type of modern optical instrument is described (in a common format) by an expert in the field. The book is intended for both industrial and academic scientists and engineers, and will be useful for undergraduate and postgraduate studies.

Advances in Optical Surface Texture Metrology covers the latest advances in the development of optical surface texture measuring instruments. Rather than concentrate on the basic principles of the optical measurement methods, this book takes a deeper dive into the operation of the instruments and the new application areas where they can be applied, with an emphasis on advanced manufacturing. Latest advances discussed will include the drive towards faster instruments for in-process applications, the ability to measure highly complex surfaces (in e.g. additive manufacturing) and advances in the use of machine learning to enhance data analysis. Key Features  Cutting-edge advances in the field New ISO framework for calibration Includes advances in artificial intelligence Includes advances in in-process measurement

This fully illustrated text explains the basic measurement techniques, describes the commercially available instruments and provides an overview of the current perception of 3-D topography analysis in the academic world and industry, and the commonly used 3-D parameters and plots for the characterizing and visualizing 3-D surface topography. It also includes new sections providing full treatment of surface characterization, filtering technology and engineered surfaces, as well as a fully updated bibliography.

This new resource explains the principles and applications of today’s digital optical measurement techniques. From start to finish, each chapter provides a concise introduction to the concepts and principles of digital optical metrology, followed by a detailed presentation of their applications. The development of all these topics, including their numerous methods, principles, and applications, has been illustrated using a large number of easy-to-understand figures. This book aims to not only help the reader identify the appropriate techniques in function of the measurement requirements, but also assess modern digital measurement systems.

The function of a component part can be profoundly affected by its surface topography. There are many examples in nature of surfaces that have a well-controlled topography to affect their function. Examples include the hydrophobic effect of the lotus leaf, the reduction of fluid drag due to the riblet structure of shark skin, the directional adhesion of the gecko foot and the angular sensitivity of the multi-faceted fly eye. Surface structuring is also being used extensively in modern manufacturing. In this way many properties can be altered, for example optical, tribological, biological and fluidic. Previously, single line (profile) measurements were adequate to control manufacture of surfaces, but as the need to control the functionality of surfaces increases, there is a growing need for three-dimensional (areal) measurement and characterisation techniques. For this reason there has been considerable research, development and standardisation of areal techniques. This book will present the areal framework that is being adopted by the international community. Whereas previous books have concentrated on the measurement aspects, this book concentrates on the characterisation techniques, i.e. how to interpret the measurement data to give the appropriate (functional) information for a given task. The first part of the book presents the characterisation methods and the second part case studies that highlight the use of areal methods in a broad range of subject areas - from automobile manufacture to archaeology. Contents Introduction to Surface Topography The Areal Field Parameters The Areal Feature Parameters Areal Filtering Methods Areal Form Removal Areal Fractal Methods Choosing the Appropriate Parameter Characterisation of Individual Areal Features Multi-Scale Signature of Surface Topography Correlation of Areal Surface Texture Parameters to Solar Cell Efficiency Characterisation of Cylinder Liner Honing Textures for Production Control Characterisation of the Mechanical Bond Strength for Copper on Glass Plating Applications Inspection of Laser Structured Cams and Conrods Road Surfaces

Due to its ruggedness and often contactless characteristics, optical systems are one of the most adopted, particularly when fast changes in displacement need to be measured. Moreover, due to the physical principles that support the operation of some of those systems (e.g., optical interferometry), they allow the measurement of linear displacements with resolutions and accuracies below the nanometer. Miniaturization and mass replications have begun to lead the optical industry in the transition from traditional analog to novel digital optics. Digital optics is information optics in its maturity. It assumes using digital processing units as an integral part of optical imaging and measurement systems. Digital processors are used both for control of optical systems and for processing optical signals. One of the main use of digital signal processing in optical imaging and measuring devices is data calibration, and, in particular, data denoising.Digital Optical Measurement Techniques presents cutting-edge information on the development and application of optical techniques and laser technology in engineering. As digital optics enter the realm of mainstream technology through the worldwide sale of consumer electronic devices, this timely book aims to present the topic of digital optics in an integrated way. Contributions are from eminent authors and researchers around the globe dealing with the practical use of devices and strategies, the estimation of results and advances and improvement of solutions and new theoretical foundations for experimental methods.This book details the state-of-the-art optical measurement capabilities available for full field dynamic response and surface topography measurements of MEMS devices. It describes how the optical measurement system is used for several of these examples. The principles of operation are important for understanding the inherent advantages and disadvantages of the technology used.

Additive manufacturing (AM) is a fast-growing sector with the ability to evoke a revolution in manufacturing due to its almost unlimited design freedom and its capability to produce personalised parts locally and with efficient material use. AM companies, however, still face technological challenges such as limited precision due to shrinkage, built-in stresses and limited process stability and robustness. Moreover, often post-processing is needed due to high roughness and remaining porosity. Qualified, trained personnel are also in short supply. In recent years, there have been dramatic improvements in AM design methods, process control, post-processing, material properties and material range. However, if AM is going to gain a significant market share, it must be developed into a true precision manufacturing method. The production of precision parts relies on three principles: Production is robust (i.e. all sensitive parameters can be controlled). Production is predictable (for example, the shrinkage that occurs is acceptable because it can be predicted and compensated in the design). Parts are measurable (as without metrology, accuracy, repeatability and quality assurance cannot be known). AM of metals is inherently a high-energy process with many sensitive and inter-related process parameters, making it susceptible to thermal distortions, defects and process drift. The complete modelling of these processes is beyond current computational power, and novel methods are needed to practicably predict performance and inform design. In addition, metal AM produces highly textured surfaces and complex surface features that stretch the limits of contemporary metrology. With so many factors to consider, there is a significant shortage of background material on how to inject precision into AM processes. Shortage in such material is an important barrier for a wider uptake of advanced manufacturing technologies, and a comprehensive book is thus needed. This book aims to inform the reader how to improve the precision of metal AM processes by tackling the three principles of robustness, predictability and metrology, and by developing computer-aided engineering methods that empower rather than limit AM design. Richard Leach is a professor in metrology at the University of Nottingham and heads up the Manufacturing Metrology Team. Prior to this position, he was at the National Physical Laboratory from 1990 to 2014. His primary love is instrument building, from concept to final installation, and his current interests are the dimensional measurement of precision and additive manufactured structures. His research themes include the measurement of surface topography, the development of methods for measuring 3D structures, the development of methods for controlling large surfaces to high resolution in industrial applications and the traceability of X-ray computed tomography. He is a leader of several professional societies and a visiting professor at Loughborough University and the Harbin Institute of Technology. Simone Carmignato is a professor in manufacturing engineering at the University of Padua. His main research activities are in the areas of precision manufacturing, dimensional metrology and industrial computed tomography. He is the author of books and hundreds of scientific papers, and he is an active member of leading technical and scientific societies. He has been chairman, organiser and keynote speaker for several international conferences, and received national and international awards, including the Taylor Medal from CIRP, the International Academy for Production Engineering.

This book provides a current overview of the theoretical and experimental aspects of some interferometry techniques applied to Topography and Astronomy. The first two chapters comprise interferometry techniques used for precise measurement of surface topography in engineering applications; while chapters three through eight are dedicated to interferometry applications related to Earth's topography. The last chapter is an application of interferometry in Astronomy, directed specifically to detection of planets outside our solar system. Each chapter offers an opportunity to expand the knowledge about interferometry techniques and encourage researchers in development of new interferometry applications.