Proceedings Of The Symposium On Diagnostic Techniques For Semiconductor Materials And Devices
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Proceedings of the Symposium on Diagnostic Techniques for Semiconductor Materials and Devices
Author | : Dieter K. Schroder,Janet L. Benton,P. Rai-Choudhury |
Publsiher | : The Electrochemical Society |
Total Pages | : 408 |
Release | : 1994 |
Genre | : Technology & Engineering |
ISBN | : 1566770920 |
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Proceedings of the Symposium on Diagnostic Techniques for Semiconductor Materials and Devices
Author | : Anonim |
Publsiher | : Unknown |
Total Pages | : 387 |
Release | : 1994 |
Genre | : Semiconductors |
ISBN | : OCLC:1319407482 |
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Proceedings of the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices
Author | : P. Rai-Choudhury |
Publsiher | : The Electrochemical Society |
Total Pages | : 496 |
Release | : 1997 |
Genre | : Technology & Engineering |
ISBN | : 1566771390 |
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Analytical and Diagnostic Techniques for Semiconductor Materials Devices and Processes
Author | : Bernd O. Kolbesen (Chemiker.) |
Publsiher | : The Electrochemical Society |
Total Pages | : 568 |
Release | : 1999 |
Genre | : Technology & Engineering |
ISBN | : 1566772397 |
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Analytical and Diagnostic Techniques for Semiconductor Materials Devices and Processes
Author | : Bernd O. Kolbesen |
Publsiher | : The Electrochemical Society |
Total Pages | : 572 |
Release | : 2003 |
Genre | : Technology & Engineering |
ISBN | : 1566773482 |
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.".. ALTECH 2003 was Symposium J1 held at the 203rd Meeting of the Electrochemical Society in Paris, France from April 27 to May 2, 2003 ... Symposium M1, Diagnostic Techniques for Semiconductor Materials and Devices, was part of the 202nd Meeting of the Electrochemical Society held in Salt Lake City, Utah, from October 21 to 25, 2002 ..."--p. iii.
Analytical and Diagnostic Techniques for Semiconductor Materials Devices and Processes 7
Author | : Dieter K. Schroder |
Publsiher | : The Electrochemical Society |
Total Pages | : 406 |
Release | : 2007 |
Genre | : Semiconductors |
ISBN | : 9781566775694 |
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Diagnostic characterization techniques for semiconductor materials, devices and device processing are addressed at this symposium. It will cover new techniques as well as advances in routine analytical technology applied to semiconductor process development and manufacture. The hardcover edition includes a CD-ROM of ECS Transactions, Volume 10, Issue 1, Analytical Techniques for Semiconductor Materials and Process Characterization 5 (ALTECH 2007). The PDF edition also includes the ALTECH 2007 papers.
Semiconductor Materials Analysis and Fabrication Process Control
Author | : G. M. Crean,R. Stuck |
Publsiher | : North Holland |
Total Pages | : 338 |
Release | : 1993-01-01 |
Genre | : Ellipsometry |
ISBN | : 0444899081 |
Download Semiconductor Materials Analysis and Fabrication Process Control Book in PDF, Epub and Kindle
Reviews current research in the development and application of diagnostic techniques for advanced materials analysis and fabrication process control. Contributions discuss the emergence and evaluation of in situ optical diagnostic techniques, such as photoreflectance and spectroellipsometry.
Advances in Imaging and Electron Physics
Author | : Anonim |
Publsiher | : Academic Press |
Total Pages | : 353 |
Release | : 1999-02-24 |
Genre | : Technology & Engineering |
ISBN | : 0080577725 |
Download Advances in Imaging and Electron Physics Book in PDF, Epub and Kindle
Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.