Reliability Testing And Characterization Of Mems Moems
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Reliability Testing and Characterization of MEMS MOEMS
Author | : Anonim |
Publsiher | : Unknown |
Total Pages | : 332 |
Release | : 2001 |
Genre | : Microelectromechanical systems |
ISBN | : UOM:39015053518646 |
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MEMS Reliability
Author | : Allyson L. Hartzell,Mark G. da Silva,Herbert R. Shea |
Publsiher | : Springer Science & Business Media |
Total Pages | : 300 |
Release | : 2010-11-02 |
Genre | : Technology & Engineering |
ISBN | : 9781441960184 |
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The successful launch of viable MEMs product hinges on MEMS reliability, the reliability and qualification for MEMs based products is not widely understood. Companies that have a deep understanding of MEMs reliability view the information as a competitive advantage and are reluctant to share it. MEMs Reliability, focuses on the reliability and manufacturability of MEMS at a fundamental level by addressing process development and characterization, material property characterization, failure mechanisms and physics of failure (POF), design strategies for improving yield, design for reliability (DFR), packaging and testing.
Reliability Testing and Characterization of MEMS MOEMS II
Author | : Rajeshuni Ramesham |
Publsiher | : Society of Photo Optical |
Total Pages | : 334 |
Release | : 2003 |
Genre | : Technology & Engineering |
ISBN | : 0819447803 |
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Reliability Testing and Characterization of MEMS MOEMS
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Author | : Rajeshuni Ramesham |
Publsiher | : Society of Photo Optical |
Total Pages | : 296 |
Release | : 2001 |
Genre | : Technology & Engineering |
ISBN | : 0819442860 |
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Reliability Packaging Testing and Characterization of MEMS MOEMS IV
Author | : Danelle Mary Tanner,Rajeshuni Ramesham |
Publsiher | : SPIE-International Society for Optical Engineering |
Total Pages | : 272 |
Release | : 2005 |
Genre | : Technology & Engineering |
ISBN | : 081945690X |
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Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
Reliability Testing and Characterization of MEMS MOEMS III
Author | : Danelle Mary Tanner,Rajeshuni Ramesham |
Publsiher | : SPIE-International Society for Optical Engineering |
Total Pages | : 0 |
Release | : 2004 |
Genre | : Technology & Engineering |
ISBN | : 0819452513 |
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Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
Component Reliability for Electronic Systems
Author | : Titu I. Băjenescu,Marius I. Bâzu |
Publsiher | : Artech House |
Total Pages | : 706 |
Release | : 2010 |
Genre | : Technology & Engineering |
ISBN | : 9781596934368 |
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The main reason for the premature breakdown of today's electronic products (computers, cars, tools, appliances, etc.) is the failure of the components used to build these products. Today professionals are looking for effective ways to minimize the degradation of electronic components to help ensure longer-lasting, more technically sound products and systems. This practical book offers engineers specific guidance on how to design more reliable components and build more reliable electronic systems. Professionals learn how to optimize a virtual component prototype, accurately monitor product reliability during the entire production process, and add the burn-in and selection procedures that are the most appropriate for the intended applications. Moreover, the book helps system designers ensure that all components are correctly applied, margins are adequate, wear-out failure modes are prevented during the expected duration of life, and system interfaces cannot lead to failure.
Sensors for Automotive Applications
Author | : Jiri Marek,Hans-Peter Trah,Yasutoshi Suzuki,Iwao Yokomori |
Publsiher | : John Wiley & Sons |
Total Pages | : 584 |
Release | : 2006-03-06 |
Genre | : Technology & Engineering |
ISBN | : 9783527605071 |
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Taken as a whole, this series covers all major fields of application for commercial sensors, as well as their manufacturing techniques and major types. As such the series does not treat bulk sensors, but rather places strong emphasis on microsensors, microsystems and integrated electronic sensor packages. Each of the individual volumes is tailored to the needs and queries of readers from the relevant branch of industry. An international team of experts from the leading companies in this field gives a detailed picture of existing as well as future applications. They discuss in detail current technologies, design and construction concepts, market considerations and commercial developments. Topics covered include vehicle safety, fuel consumption, air conditioning, emergency control, traffic control systems, and electronic guidance using radar and video.