The Statistical Analysis Of Spatial Pattern

In a contribution (Bartlett, 1971 a) to the Symposium on Statistical Ecology at Yale in 1969, I noted in my introductory remarks that that paper was not intended to be in any way a review of statistical techniques for analysing spatial patterns. My contribution to a conference at Sheffield in 1973 aimed, at least in part, to supply such a review and forms the basis of this monograph; but in these prefatory remarks I must still make clear what I decided to discuss, and what I have omitted. Broadly speaking, the coverage is that included in seminars and lectures I have given on this theme since 1969. We may divide problems of spatial pattern (in contrast with complete random chaos) into (i) detecting departures from randomness, Oi) analysing such departures when detected, for example, in relation to some stochastic model and (iii) special problems which require separate consideration; for example, sophisticated problems of pattern recognition in specific fields, such as the computer reading of handwriting or recognition of chromosomes.

This is a new edition of the classic monograph, published in 1983, that described those statistical methods that are used to analyse spatial data. This edition has been entirely updated with the latest developments in the analysis of spatial data which have grown to become a large area of concern in environmental and epidemiological research. There is a website connected with the volume that contains additional data sets and a new chapter on spatial epidemiology. It is appropriate for graduate level statisticians in various disciplines.

Spatial point processes are mathematical models used to describe and analyse the geometrical structure of patterns formed by objects that are irregularly or randomly distributed in one-, two- or three-dimensional space. Examples include locations of trees in a forest, blood particles on a glass plate, galaxies in the universe, and particle centres in samples of material. Numerous aspects of the nature of a specific spatial point pattern may be described using the appropriate statistical methods. Statistical Analysis and Modelling of Spatial Point Patterns provides a practical guide to the use of these specialised methods. The application-oriented approach helps demonstrate the benefits of this increasingly popular branch of statistics to a broad audience. The book: Provides an introduction to spatial point patterns for researchers across numerous areas of application Adopts an extremely accessible style, allowing the non-statistician complete understanding Describes the process of extracting knowledge from the data, emphasising the marked point process Demonstrates the analysis of complex datasets, using applied examples from areas including biology, forestry, and materials science Features a supplementary website containing example datasets. Statistical Analysis and Modelling of Spatial Point Patterns is ideally suited for researchers in the many areas of application, including environmental statistics, ecology, physics, materials science, geostatistics, and biology. It is also suitable for students of statistics, mathematics, computer science, biology and geoinformatics.

The Encyclopedia of GIS provides a comprehensive and authoritative guide, contributed by experts and peer-reviewed for accuracy, and alphabetically arranged for convenient access. The entries explain key software and processes used by geographers and computational scientists. Major overviews are provided for nearly 200 topics: Geoinformatics, Spatial Cognition, and Location-Based Services and more. Shorter entries define specific terms and concepts. The reference will be published as a print volume with abundant black and white art, and simultaneously as an XML online reference with hyperlinked citations, cross-references, four-color art, links to web-based maps, and other interactive features.

Modern Statistical Methodology and Software for Analyzing Spatial Point PatternsSpatial Point Patterns: Methodology and Applications with R shows scientific researchers and applied statisticians from a wide range of fields how to analyze their spatial point pattern data. Making the techniques accessible to non-mathematicians, the authors draw on th

Introduction; Preliminary testing for mapped patterns; Analysis of sparsely sampled patterns; Spatial point processes; Analysis of mapped patterns; Multivariate spatial point processes; Analysis of multivariate patterns.

In recent years there has been a growing interest in and concern for the development of a sound spatial statistical body of theory. This work has been undertaken by geographers, statisticians, regional scientists, econometricians, and others (e. g. , sociologists). It has led to the publication of a number of books, including Cliff and Ord's Spatial Processes (1981), Bartlett's The Statistical Analysis of Spatial Pattern (1975), Ripley's Spatial Statistics (1981), Paelinck and Klaassen's Spatial Economet~ics (1979), Ahuja and Schachter's Pattern Models (1983), and Upton and Fingleton's Spatial Data Analysis by Example (1985). The first of these books presents a useful introduction to the topic of spatial autocorrelation, focusing on autocorrelation indices and their sampling distributions. The second of these books is quite brief, but nevertheless furnishes an eloquent introduction to the rela tionship between spatial autoregressive and two-dimensional spectral models. Ripley's book virtually ignores autoregressive and trend surface modelling, and focuses almost solely on point pattern analysis. Paelinck and Klaassen's book closely follows an econometric textbook format, and as a result overlooks much of the important material necessary for successful spatial data analy sis. It almost exclusively addresses distance and gravity models, with some treatment of autoregressive modelling. Pattern Models supplements Cliff and Ord's book, which in combination provide a good introduction to spatial data analysis. Its basic limitation is a preoccupation with the geometry of planar patterns, and hence is very narrow in scope.