X Ray Science

This book is intended to provide a treatment of the production, properties and applications of X-rays suitable for undergraduate courses in physics. It is hoped that parts of it, at least, will be useful to students on other courses in physics, materials science, metallurgy, chemistry, engineering, etc. at various levels. It is also hoped that parts of it will serve as an introduction to the subject of X-ray crystallography, and to this end the treatment of X-ray diffraction has been designed to show the relation between the simple approach and the more sophisticated treatments. During many years of teaching this subject to Degree, Diploma in Technology and Higher National Certificate students, I have been unable to find a single book which attempts to cover the whole of this field. This lack of a treatment of X-rays and their applications in one volume has prompted me to attempt to fill the gap and this present volume is the result. Obviously in writing such a book I have referred to many existing books and I acknowledge my indebtedness to the authors of all the books which I have used. I believe that all these books are included in the re ferences at the ends of the chapters but if I have omitted any, then my apologies are offered to the authors concerned.

This open access book gives a complete and comprehensive introduction to the fields of medical imaging systems, as designed for a broad range of applications. The authors of the book first explain the foundations of system theory and image processing, before highlighting several modalities in a dedicated chapter. The initial focus is on modalities that are closely related to traditional camera systems such as endoscopy and microscopy. This is followed by more complex image formation processes: magnetic resonance imaging, X-ray projection imaging, computed tomography, X-ray phase-contrast imaging, nuclear imaging, ultrasound, and optical coherence tomography.

Many X-Ray Free-Electron Lasers (X-FELs) have been designed, built and commissioned since the first lasing of the Linac Coherent Light Source in the hard and soft X-ray regions, and great progress has been made in improving their performance and extending their capabilities. Meanwhile, experimental techniques to exploit the unique properties of X-FELs to explore atomic and molecular systems of interest to physics, chemistry, biology and the material sciences have also been developed. As a result, our knowledge of atomic and molecular science has been greatly extended. Nevertheless, there is still much to be accomplished, and the potential for discovery with X-FELs is still largely unexplored. The next generation of scientists will need to be well versed in both particle beams/FEL physics and X-ray photon science. This book presents material from the Enrico Fermi summer school: Physics of and Science with X-Ray Free-Electron Lasers, held at the Enrico Fermi International School of Physics in Varenna, Italy, from 26 June - 1 July 2017. The lectures presented at the school were aimed at introducing graduate students and young scientists to this fast growing and exciting scientific area, and subjects covered include basic accelerator and FEL physics, as well as an introduction to the main research topics in X-FEL-based biology, atomic molecular optical science, material sciences, high-energy density physics and chemistry. Bridging the gap between accelerator/FEL physicists and scientists from other disciplines, the book will be of interest to all those working in the field.

To anyone who is interested in surface chemical analysis of materials on the nanometer scale, this book is prepared to give appropriate information. Based on typical application examples in materials science, a concise approach to all aspects of quantitative analysis of surfaces and thin films with AES and XPS is provided. Starting from basic principles which are step by step developed into practically useful equations, extensive guidance is given to graduate students as well as to experienced researchers. Key chapters are those on quantitative surface analysis and on quantitative depth profiling, including recent developments in topics such as surface excitation parameter and backscattering correction factor. Basic relations are derived for emission and excitation angle dependencies in the analysis of bulk material and of fractional nano-layer structures, and for both smooth and rough surfaces. It is shown how to optimize the analytical strategy, signal-to-noise ratio, certainty and detection limit. Worked examples for quantification of alloys and of layer structures in practical cases (e.g. contamination, evaporation, segregation and oxidation) are used to critically review different approaches to quantification with respect to average matrix correction factors and matrix relative sensitivity factors. State-of-the-art issues in quantitative, destructive and non-destructive depth profiling are discussed with emphasis on sputter depth profiling and on angle resolved XPS and AES. Taking into account preferential sputtering and electron backscattering corrections, an introduction to the mixing-roughness-information depth (MRI) model and its extensions is presented.

The properties of soft-matter thin films (e.g. liquid films, polymer coatings, Langmuir-Blodgett multilayers) nowadays play an important role in materials science. They are also very exciting with respect to fundamental questions: In thin films, liquids and polymers may be considered as trapped in a quasi-two-dimensional geometry. This confined geometry is expected to alter the properties and structures of these materials considerably. This volume is dedicated to the scattering of x-rays by soft-matter interfaces. X-ray scattering under grazing angles is the only tool to investigating these materials on atomic and mesoscopic length scales. A review of the field is presented with many examples.

X-Ray Crystallography is a well-balanced, thorough, and clearly written introduction to the most important and widely practiced technique to determine the arrangement of atoms in molecules and solids. Featuring excellent illustrations and homework problems throughout, the book is intended both for advanced undergraduate and graduate students who are learning the subject for the first time, as well as for those who have practical experience but seek a text summarizing the theory of diffraction and X-ray crystallography. It is organized into three parts: Part 1 deals with symmetry and space groups, Part 2 explains the physics of X rays and diffraction, and Part 3 examines the methods for solving and refining crystal structures. The discussion proceeds in a logical and clear fashion from the fundamentals through to advanced topics such as disorder, twinning, microfocus sources, low energy electron diffraction, charge flipping, protein crystallography, the maximum likelihood method of refinement, and powder, neutron, and electron diffraction. The author's clear writing style and distinctive approach is well suited for chemists, biologists, materials scientists, physicists, and scientists from related disciplines.

This volume is based on papers presented at the International Symposium on X-Ray Microscopy held at Brookhaven National Laboratory, Upton NY, August 31-September 4, 1987. Previous recent symposia on the sub ject were held in New York in 1979, Gottingen in 1983 and Taipei in 1986. Developments in x-ray microscopy continue at a rapid pace, with im portant advances in all major areas: x-ray sources, optics and components, and microscopes and imaging systems. Taken as a whole, the work pre sented here emphasizes three major directions: (a) improvements in the capability and image-quality of x-ray microscopy, expressed principally in systems attached to large, high-brightness x-ray sources; (b) greater access to x-ray microscopy, expressed chiefly in systems employing small, often pulsed, x-ray sources; and (c) increased rate of exploration of applications of x-ray microscopy. The number of papers presented at the symposium has roughly dou bled compared with that of its predecessors. While we are delighted at this growth as a manifestation of vitality and rapid growth of the field, we did have to ask the authors to limit the length of their papers and to submit them in camera-ready form. We thank the authors for their con tributions and for their efforts in adhering to the guidelines on manuscript preparation.

This book provides a concise survey of modern theoretical concepts of X-ray materials analysis. The principle features of the book are: basics of X-ray scattering, interaction between X-rays and matter and new theoretical concepts of X-ray scattering. The various X-ray techniques are considered in detail: high-resolution X-ray diffraction, X-ray reflectivity, grazing-incidence small-angle X-ray scattering and X-ray residual stress analysis. All the theoretical methods presented use the unified physical approach. This makes the book especially useful for readers learning and performing data analysis with different techniques. The theory is applicable to studies of bulk materials of all kinds, including single crystals and polycrystals as well as to surface studies under grazing incidence. The book appeals to researchers and graduate students alike.