Automated Procedures For Characterizing Specific Equipment Productivity Losses With Applications In The Semiconductor Manufacturing Industry
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Automated Procedures for Characterizing Specific Equipment Productivity Losses with Applications in the Semiconductor Manufacturing Industry
Author | : David Paul Busing |
Publsiher | : Unknown |
Total Pages | : 412 |
Release | : 1998 |
Genre | : Electronic Book |
ISBN | : UCAL:C3409165 |
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Dissertation Abstracts International
Author | : Anonim |
Publsiher | : Unknown |
Total Pages | : 700 |
Release | : 1999 |
Genre | : Dissertations, Academic |
ISBN | : STANFORD:36105028425226 |
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Learning by Using in Semiconductor Manufacturing
Author | : Paolo Palezzato |
Publsiher | : Unknown |
Total Pages | : 640 |
Release | : 2000 |
Genre | : Electronic Book |
ISBN | : UCAL:C2840843 |
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American Doctoral Dissertations
Author | : Anonim |
Publsiher | : Unknown |
Total Pages | : 784 |
Release | : 1998 |
Genre | : Dissertation abstracts |
ISBN | : UOM:39015086908186 |
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Analytical Techniques for Semiconductor Materials and Process Characterization 6 ALTECH 2009
Author | : Bernd O. Kolbesen |
Publsiher | : The Electrochemical Society |
Total Pages | : 479 |
Release | : 2009-09 |
Genre | : Semiconductors |
ISBN | : 9781566777407 |
Download Analytical Techniques for Semiconductor Materials and Process Characterization 6 ALTECH 2009 Book in PDF, Epub and Kindle
The proceedings of ALTECH 2009 address recent developments and applications of analytical techniques for semiconductor materials, processes and devices. The papers comprise techniques of elemental and structural analysis for bulk and surface impurities and defects, thin films as well as dopants in ultra-shallow junctions.
University of Michigan Official Publication
Author | : University of Michigan |
Publsiher | : UM Libraries |
Total Pages | : 408 |
Release | : 2000 |
Genre | : Education, Higher |
ISBN | : UOM:39015078741165 |
Download University of Michigan Official Publication Book in PDF, Epub and Kindle
Each number is the catalogue of a specific school or college of the University.
Machine Vision Applications in Industrial Inspection
Author | : Anonim |
Publsiher | : Unknown |
Total Pages | : 216 |
Release | : 1997 |
Genre | : Computer vision |
ISBN | : UOM:39015036320128 |
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IEEE VLSI Test Symposium
Author | : Anonim |
Publsiher | : Unknown |
Total Pages | : 210 |
Release | : 1990 |
Genre | : Application-specific integrated circuits |
ISBN | : UOM:39015018870157 |
Download IEEE VLSI Test Symposium Book in PDF, Epub and Kindle