Automated Procedures for Characterizing Specific Equipment Productivity Losses with Applications in the Semiconductor Manufacturing Industry

Automated Procedures for Characterizing Specific Equipment Productivity Losses with Applications in the Semiconductor Manufacturing Industry
Author: David Paul Busing
Publsiher: Unknown
Total Pages: 412
Release: 1998
Genre: Electronic Book
ISBN: UCAL:C3409165

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Dissertation Abstracts International

Dissertation Abstracts International
Author: Anonim
Publsiher: Unknown
Total Pages: 700
Release: 1999
Genre: Dissertations, Academic
ISBN: STANFORD:36105028425226

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Learning by Using in Semiconductor Manufacturing

Learning by Using in Semiconductor Manufacturing
Author: Paolo Palezzato
Publsiher: Unknown
Total Pages: 640
Release: 2000
Genre: Electronic Book
ISBN: UCAL:C2840843

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American Doctoral Dissertations

American Doctoral Dissertations
Author: Anonim
Publsiher: Unknown
Total Pages: 784
Release: 1998
Genre: Dissertation abstracts
ISBN: UOM:39015086908186

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Analytical Techniques for Semiconductor Materials and Process Characterization 6 ALTECH 2009

Analytical Techniques for Semiconductor Materials and Process Characterization 6  ALTECH 2009
Author: Bernd O. Kolbesen
Publsiher: The Electrochemical Society
Total Pages: 479
Release: 2009-09
Genre: Semiconductors
ISBN: 9781566777407

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The proceedings of ALTECH 2009 address recent developments and applications of analytical techniques for semiconductor materials, processes and devices. The papers comprise techniques of elemental and structural analysis for bulk and surface impurities and defects, thin films as well as dopants in ultra-shallow junctions.

University of Michigan Official Publication

University of Michigan Official Publication
Author: University of Michigan
Publsiher: UM Libraries
Total Pages: 408
Release: 2000
Genre: Education, Higher
ISBN: UOM:39015078741165

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Each number is the catalogue of a specific school or college of the University.

Machine Vision Applications in Industrial Inspection

Machine Vision Applications in Industrial Inspection
Author: Anonim
Publsiher: Unknown
Total Pages: 216
Release: 1997
Genre: Computer vision
ISBN: UOM:39015036320128

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IEEE VLSI Test Symposium

IEEE VLSI Test Symposium
Author: Anonim
Publsiher: Unknown
Total Pages: 210
Release: 1990
Genre: Application-specific integrated circuits
ISBN: UOM:39015018870157

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