Radiation Effects In Electronics
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Radiation Effects in Electronics
Author | : Anonim |
Publsiher | : ASTM International |
Total Pages | : 248 |
Release | : 1965 |
Genre | : Electronic apparatus and appliances |
ISBN | : 9182736450XXX |
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Ionizing Radiation Effects in Electronics
Author | : Marta Bagatin,Simone Gerardin |
Publsiher | : CRC Press |
Total Pages | : 394 |
Release | : 2018-09-03 |
Genre | : Technology & Engineering |
ISBN | : 9781498722636 |
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Ionizing Radiation Effects in Electronics: From Memories to Imagers delivers comprehensive coverage of the effects of ionizing radiation on state-of-the-art semiconductor devices. The book also offers valuable insight into modern radiation-hardening techniques. The text begins by providing important background information on radiation effects, their underlying mechanisms, and the use of Monte Carlo techniques to simulate radiation transport and the effects of radiation on electronics. The book then: Explains the effects of radiation on digital commercial devices, including microprocessors and volatile and nonvolatile memories—static random-access memories (SRAMs), dynamic random-access memories (DRAMs), and Flash memories Examines issues like soft errors, total dose, and displacement damage, together with hardening-by-design solutions for digital circuits, field-programmable gate arrays (FPGAs), and mixed-analog circuits Explores the effects of radiation on fiber optics and imager devices such as complementary metal-oxide-semiconductor (CMOS) sensors and charge-coupled devices (CCDs) Featuring real-world examples, case studies, extensive references, and contributions from leading experts in industry and academia, Ionizing Radiation Effects in Electronics: From Memories to Imagers is suitable both for newcomers who want to become familiar with radiation effects and for radiation experts who are looking for more advanced material or to make effective use of beam time.
Radiation Effects and Soft Errors in Integrated Circuits and Electronic Devices
Author | : Ronald Donald Schrimpf,Dan M. Fleetwood |
Publsiher | : World Scientific |
Total Pages | : 349 |
Release | : 2004 |
Genre | : Technology & Engineering |
ISBN | : 9789812389404 |
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This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide-semiconductor (MOS), and compound semi-conductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level.
The Effects of Radiation on Electronic Systems
Author | : George Messenger,Milton S. Ash |
Publsiher | : Springer |
Total Pages | : 984 |
Release | : 1992-05-14 |
Genre | : Juvenile Nonfiction |
ISBN | : UOM:39015025239354 |
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Testing at the Speed of Light
Author | : National Academies of Sciences, Engineering, and Medicine,Division on Engineering and Physical Sciences,National Materials and Manufacturing Board,Committee on Space Radiation Effects Testing Infrastructure for the U.S. Space Program |
Publsiher | : National Academies Press |
Total Pages | : 89 |
Release | : 2018-06-08 |
Genre | : Science |
ISBN | : 9780309470827 |
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Spacecraft depend on electronic components that must perform reliably over missions measured in years and decades. Space radiation is a primary source of degradation, reliability issues, and potentially failure for these electronic components. Although simulation and modeling are valuable for understanding the radiation risk to microelectronics, there is no substitute for testing, and an increased use of commercial-off-the- shelf parts in spacecraft may actually increase requirements for testing, as opposed to simulation and modeling. Testing at the Speed of Light evaluates the nation's current capabilities and future needs for testing the effects of space radiation on microelectronics to ensure mission success and makes recommendations on how to provide effective stewardship of the necessary radiation test infrastructure for the foreseeable future.
Radiation Effects on Electronic Systems
Author | : Henning L. Olesen |
Publsiher | : Springer |
Total Pages | : 234 |
Release | : 2013-12-11 |
Genre | : Technology & Engineering |
ISBN | : 9781489957054 |
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Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices
Author | : Ronald D Schrimpf,Daniel M Fleetwood |
Publsiher | : World Scientific |
Total Pages | : 349 |
Release | : 2004-07-29 |
Genre | : Technology & Engineering |
ISBN | : 9789814482158 |
Download Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices Book in PDF, Epub and Kindle
This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide-semiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level.
Ionizing Radiation Effects in Electronics
![Ionizing Radiation Effects in Electronics](https://youbookinc.com/wp-content/themes/schema-lite/cover.jpg)
Author | : Marta Bagatin,Simone Gerardin |
Publsiher | : Unknown |
Total Pages | : 394 |
Release | : 2018 |
Genre | : Electronic Book |
ISBN | : OCLC:1128153924 |
Download Ionizing Radiation Effects in Electronics Book in PDF, Epub and Kindle
Ionizing Radiation Effects in Electronics: From Memories to Imagers delivers comprehensive coverage of the effects of ionizing radiation on state-of-the-art semiconductor devices. The book also offers valuable insight into modern radiation-hardening techniques. The text begins by providing important background information on radiation effects, their underlying mechanisms, and the use of Monte Carlo techniques to simulate radiation transport and the effects of radiation on electronics. The book then: Explains the effects of radiation on digital commercial devices, including microprocessors and volatile and nonvolatile memories-static random-access memories (SRAMs), dynamic random-access memories (DRAMs), and Flash memories Examines issues like soft errors, total dose, and displacement damage, together with hardening-by-design solutions for digital circuits, field-programmable gate arrays (FPGAs), and mixed-analog circuits Explores the effects of radiation on fiber optics and imager devices such as complementary metal-oxide-semiconductor (CMOS) sensors and charge-coupled devices (CCDs) Featuring real-world examples, case studies, extensive references, and contributions from leading experts in industry and academia, Ionizing Radiation Effects in Electronics: From Memories to Imagers is suitable both for newcomers who want to become familiar with radiation effects and for radiation experts who are looking for more advanced material or to make effective use of beam time.