Reliability of Semiconductor Lasers and Optoelectronic Devices

Reliability of Semiconductor Lasers and Optoelectronic Devices
Author: Robert Herrick,Osamu Ueda
Publsiher: Woodhead Publishing
Total Pages: 334
Release: 2021-03-06
Genre: Technology & Engineering
ISBN: 9780128192559

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Reliability of Semiconductor Lasers and Optoelectronic Devices simplifies complex concepts of optoelectronics reliability with approachable introductory chapters and a focus on real-world applications. This book provides a brief look at the fundamentals of laser diodes, introduces reliability qualification, and then presents real-world case studies discussing the principles of reliability and what occurs when these rules are broken. Then this book comprehensively looks at optoelectronics devices and the defects that cause premature failure in them and how to control those defects. Key materials and devices are reviewed including silicon photonics, vertical-cavity surface-emitting lasers (VCSELs), InGaN LEDs and lasers, and AlGaN LEDs, covering the majority of optoelectronic devices that we use in our everyday lives, powering the Internet, telecommunication, solid-state lighting, illuminators, and many other applications. This book features contributions from experts in industry and academia working in these areas and includes numerous practical examples and case studies. This book is suitable for new entrants to the field of optoelectronics working in R&D. • Includes case studies and numerous examples showing best practices and common mistakes affecting optoelectronics reliability written by experts working in the industry • Features the first wide-ranging and comprehensive overview of fiber optics reliability engineering, covering all elements of the practice from building a reliability laboratory, qualifying new products, to improving reliability on mature products. • Provides a look at the reliability issues and failure mechanisms for silicon photonics, VCSELs, InGaN LEDs and lasers, AIGaN LEDs, and more.

Reliability and Degradation of Semiconductor Lasers and LEDs

Reliability and Degradation of Semiconductor Lasers and LEDs
Author: Mitsuo Fukuda
Publsiher: Artech House on Demand
Total Pages: 343
Release: 1991-01-01
Genre: Technology & Engineering
ISBN: 0890064652

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This comparative tutorial describes the reasons behind device failures and provides practical information on what can be done to minimize failure-prone designs and enhance device reliability. The text demonstrates how, with such advantages as smaller size, low-cost and simple operation, LEDs are well suited for a wide range of applications - especially in the field of optical fibre communication. This book should prove of interest to engineers and scientists in research, design, manufacturing and development of semiconductor lasers, LEDs and optical transmission systems.

Advanced Laser Diode Reliability

Advanced Laser Diode Reliability
Author: Massimo Vanzi,Laurent Bechou,Mitsuo Fukuda,Giovanna Mura
Publsiher: Elsevier
Total Pages: 270
Release: 2021-07-24
Genre: Technology & Engineering
ISBN: 9780081010891

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Advanced Laser Diode Reliability focuses on causes and effects of degradations of state-of-the-art semiconductor laser diodes. It aims to provide a tool for linking practical measurements to physical diagnostics. To this purpose, it reviews the current technologies, addressing their peculiar details that can promote specific failure mechanisms. Two sections will support this kernel: a) Failure Analysis techniques, procedures and examples; b) Device-oriented laser modelling and parameter extraction. Talk about Natural continuity with the most widespread existing textbooks, published by Mitsuo Fukuda Present the extension to new failure mechanisms, new technologies, new application fields, new environments Introduce a specific self-consistent model for the physical description of a laser diode, expressed in terms of practically measurable quantities

Materials and Reliability Handbook for Semiconductor Optical and Electron Devices

Materials and Reliability Handbook for Semiconductor Optical and Electron Devices
Author: Osamu Ueda,Stephen J. Pearton
Publsiher: Springer Science & Business Media
Total Pages: 618
Release: 2012-09-24
Genre: Technology & Engineering
ISBN: 9781461443360

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Materials and Reliability Handbook for Semiconductor Optical and Electron Devices provides comprehensive coverage of reliability procedures and approaches for electron and photonic devices. These include lasers and high speed electronics used in cell phones, satellites, data transmission systems and displays. Lifetime predictions for compound semiconductor devices are notoriously inaccurate due to the absence of standard protocols. Manufacturers have relied on extrapolation back to room temperature of accelerated testing at elevated temperature. This technique fails for scaled, high current density devices. Device failure is driven by electric field or current mechanisms or low activation energy processes that are masked by other mechanisms at high temperature. The Handbook addresses reliability engineering for III-V devices, including materials and electrical characterization, reliability testing, and electronic characterization. These are used to develop new simulation technologies for device operation and reliability, which allow accurate prediction of reliability as well as the design specifically for improved reliability. The Handbook emphasizes physical mechanisms rather than an electrical definition of reliability. Accelerated aging is useful only if the failure mechanism is known. The Handbook also focuses on voltage and current acceleration stress mechanisms.

Reliability and Radiation Effects in Compound Semiconductors

Reliability and Radiation Effects in Compound Semiconductors
Author: Anonim
Publsiher: Unknown
Total Pages: 135
Release: 2024
Genre: Electronic Book
ISBN: 9789814467650

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Fabrication Testing and Reliability of Semiconductor Lasers

Fabrication  Testing  and Reliability of Semiconductor Lasers
Author: Anonim
Publsiher: Unknown
Total Pages: 190
Release: 1997
Genre: Semiconductor lasers
ISBN: UOM:39015040314893

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Semiconductor Device Reliability

Semiconductor Device Reliability
Author: A. Christou,B.A. Unger
Publsiher: Springer Science & Business Media
Total Pages: 571
Release: 2012-12-06
Genre: Technology & Engineering
ISBN: 9789400924826

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This publication is a compilation of papers presented at the Semiconductor Device Reliabi lity Workshop sponsored by the NATO International Scientific Exchange Program. The Workshop was held in Crete, Greece from June 4 to June 9, 1989. The objective of the Workshop was to review and to further explore advances in the field of semiconductor reliability through invited paper presentations and discussions. The technical emphasis was on quality assurance and reliability of optoelectronic and high speed semiconductor devices. The primary support for the meeting was provided by the Scientific Affairs Division of NATO. We are indebted to NATO for their support and to Dr. Craig Sinclair, who admin isters this program. The chapters of this book follow the format and order of the sessions of the meeting. Thirty-six papers were presented and discussed during the five-day Workshop. In addi tion, two panel sessions were held, with audience participation, where the particularly controversial topics of bum-in and reliability modeling and prediction methods were dis cussed. A brief review of these sessions is presented in this book.

Reliability Problems of Semiconductor Lasers

Reliability Problems of Semiconductor Lasers
Author: P. G. Eliseev
Publsiher: Unknown
Total Pages: 328
Release: 1991
Genre: Semiconductor lasers
ISBN: UOM:39015028408360

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