Semiconductor Measurement Technology
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Semiconductor Measurement Technology
Author | : United States. National Bureau of Standards |
Publsiher | : Unknown |
Total Pages | : 124 |
Release | : 1977 |
Genre | : Semiconductors |
ISBN | : UIUC:30112104130692 |
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Semiconductor Measurement Technology
Author | : Anonim |
Publsiher | : Unknown |
Total Pages | : 104 |
Release | : 1975 |
Genre | : Semiconductors |
ISBN | : UCSD:31822011502580 |
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Semiconductor Measurement Technology
Author | : Institute for Applied Technology (U.S.). Electronic Technology Division |
Publsiher | : Unknown |
Total Pages | : 332 |
Release | : 1973 |
Genre | : Semiconductors |
ISBN | : UCSD:31822020261780 |
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Semiconductor Measurement Technology
Author | : W. Murray Bullis |
Publsiher | : Unknown |
Total Pages | : 68 |
Release | : 1975 |
Genre | : Semiconductors |
ISBN | : UIUC:30112104131559 |
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Semiconductor Measurement Technology
Author | : Anonim |
Publsiher | : Unknown |
Total Pages | : 88 |
Release | : 1975 |
Genre | : Semiconductors |
ISBN | : UCSD:31822012090239 |
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Semiconductor Measurement Technology
Author | : National Institute of Standards and Technology (U.S.) |
Publsiher | : Unknown |
Total Pages | : 140 |
Release | : 1990 |
Genre | : Semiconductors |
ISBN | : IND:30000097323293 |
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Semiconductor Measurement Technology
Author | : United States. National Bureau of Standards |
Publsiher | : Unknown |
Total Pages | : 84 |
Release | : 1978 |
Genre | : Semiconductors |
ISBN | : PSU:000071918396 |
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Semiconductor Measurement Technology
Author | : W. Murray Bullis |
Publsiher | : Unknown |
Total Pages | : 86 |
Release | : 1976 |
Genre | : Semiconductors |
ISBN | : OCLC:217200133 |
Download Semiconductor Measurement Technology Book in PDF, Epub and Kindle
;Contents: Resistivity; dopant profiles; Crystal defects and contaminants; Oxide film characterization; Test patterns; Photolithography; Epitaxial layer thickness; Wafer inspection and test; Interconnection bonding; Hermeticity; Thermal properties of devices.