Ultrafast Lasers Probe Phenomena In Bulk And Microstructure Semiconductors
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Ultrafast Lasers Probe Phenomena in Bulk and Microstructure Semiconductors
Author | : Robert R. Alfano |
Publsiher | : SPIE-International Society for Optical Engineering |
Total Pages | : 208 |
Release | : 1987 |
Genre | : Science |
ISBN | : UOM:39015011863647 |
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Ultrafast Laser Probe Phenomena in Bulk and Microstructure Semiconductors II
Author | : Anonim |
Publsiher | : Unknown |
Total Pages | : 298 |
Release | : 1988 |
Genre | : Hot carriers |
ISBN | : UOM:39015013830545 |
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Ultrafast Laser Probe Phenomena in Bulk and Microstructure Semiconductors III
Author | : Robert R. Alfano |
Publsiher | : SPIE-International Society for Optical Engineering |
Total Pages | : 232 |
Release | : 1990 |
Genre | : Science |
ISBN | : UOM:39015019448961 |
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Ultrafast Spectroscopy of Semiconductors and Semiconductor Nanostructures
Author | : Jagdeep Shah |
Publsiher | : Springer Science & Business Media |
Total Pages | : 386 |
Release | : 2013-11-11 |
Genre | : Science |
ISBN | : 9783662032992 |
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Optical Characterization of Semiconductors
Author | : Sidney Perkowitz |
Publsiher | : Elsevier |
Total Pages | : 229 |
Release | : 2012-12-02 |
Genre | : Technology & Engineering |
ISBN | : 9780080984278 |
Download Optical Characterization of Semiconductors Book in PDF, Epub and Kindle
This is the first book to explain, illustrate, and compare the most widely used methods in optics: photoluminescence, infrared spectroscopy, and Raman scattering. Written with non-experts in mind, the book develops the background needed to understand the why and how of each technique, but does not require special knowledge of semiconductors or optics. Each method is illustrated with numerous case studies. Practical information drawn from the authors experience is given to help establish optical facilities, including commercial sources for equipment, and experimental details. For industrial scientists with specific problems in semiconducting materials; for academic scientists who wish to apply their spectroscopic methods to characterization problems; and for students in solid state physics, materials science and engineering, and semiconductor electronics and photonics, this book provides a unique overview, bringing together these valuable techniques in a coherent wayfor the first time. Discusses and compares infrared, Raman, and photoluminescence methods Enables readers to choose the best method for a given problem Illustrates applications to help non-experts and industrial users, with answers to selected common problems Presents fundamentals with examples from the semiconductor literature without excessive abstract discussion Features equipment lists and discussion of techniques to help establish characterization laboratories
Ultrafast Lasers Probe Phenomena in Semiconductors and Superconductors
Author | : Society of Photo-optical Instrumentation Engineers |
Publsiher | : SPIE-International Society for Optical Engineering |
Total Pages | : 292 |
Release | : 1992 |
Genre | : Science |
ISBN | : UOM:39015029190470 |
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Festschrift In Honor Of Rogerio Cerqueira Leite
Author | : Cylon Eudoxio Tricot Goncalves Da Silva,Minko Balkanski,J M Worlock |
Publsiher | : World Scientific |
Total Pages | : 383 |
Release | : 1991-06-04 |
Genre | : Electronic Book |
ISBN | : 9789814556514 |
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This volume will contain contributions from researchers who have been associated with Professor Leite's long career in science and science management. After an extremely successful career as a research physicist at Bell Labs, Professor Leite returned to Brazil, where he was instrumental in founding the Institute of Physics of the State University of Campinas. His record in research and scientific leadership, together with his concern with social issues related to Science and Technology, has made him one of the most respected voices of the Brazilian scientific community.The contributions in this volume are centered around Optical Properties of Condensed Matter. However, given the broad spectrum of Professor Leite's activities, it is natural that some authors have contributed papers on other fields.
Spectroscopy of Semiconductor Microstructures
Author | : Gerhard Fasol,Annalisa Fasolino,Paolo Lugli |
Publsiher | : Springer Science & Business Media |
Total Pages | : 661 |
Release | : 2013-06-29 |
Genre | : Science |
ISBN | : 9781475765656 |
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Proceedings of a NATO ARW held in Venice, Italy, May 9-13, 1989