Magnetic Microscopy Of Nanostructures

A comprehensive collection of overview articles on novel microscopy methods for imaging magnetic structures on the nanoscale. Written by leading scientists in the field, the book covers synchrotron based methods, spin-polarized electron methods, and scanning probe techniques. It constitutes a valuable source of reference for graduate students and newcomers to the field.

This book presents the important analytical technique of magnetic microscopy. This method is applied to analyze layered structures with high resolution. This book presents a number of layer-resolving magnetic imaging techniques that have evolved recently. Many exciting new developments in magnetism rely on the ability to independently control the magnetization in two or more magnetic layers in micro- or nanostructures. This in turn requires techniques with the appropriate spatial resolution and magnetic sensitivity. The book begins with an introductory overview, explains then the principles of the various techniques and gives guidance to their use. Selected examples demonstrate the specific strengths of each method. Thus the book is a valuable resource for all scientists and practitioners investigating and applying magnetic layered structures.

This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book is written by international experts from the top nano-research groups that specialize in nanomaterials characterization. The book will appeal to nanomaterials researchers, and to SEM development specialists.

Sixth volume of a 40 volume series on nanoscience and nanotechnology, edited by the renowned scientist Challa S.S.R. Kumar. This handbook gives a comprehensive overview about Magnetic Characterization Techniques for Nanomaterials. Modern applications and state-of-the-art techniques are covered and make this volume an essential reading for research scientists in academia and industry.

Advanced magnetic nanostructures is an emerging field in magnetism and nanotechnology, but the literature consists of a rich variety of original papers and parts of reviews and books whose scope is comparatively broad. This calls for a book with specific emphasis on state-of-the-art synthetic methods for fabricating, characterizing and theoretically modeling new magnetic nanostructures. This book is intended to provide a comprehensive overview of the present state of the field. Leading researchers world-wide have contributed a survey of their special ties to guide the reader through the exploding literature in nanomagnetic structures. The focus is on deliberately structured nanomagnets. It includes cluster assembled, self-organized and patterned thin films but excludes, for example, multilayered thin films. We target both industrial and academic researchers in magnetism and related areas, such as nanotechnology, materials science, and theoretical solid-state physics.

Nanostructured materials take on an enormously rich variety of properties and promise exciting new advances in micromechanical, electronic, and magnetic devices as well as in molecular fabrications. The structure-composition-processing-property relationships for these sub 100 nm-sized materials can only be understood by employing an array of modern microscopy and microanalysis tools. Handbook of Microscopy for Nanotechnology aims to provide an overview of the basics and applications of various microscopy techniques for nanotechnology. This handbook highlights various key microcopic techniques and their applications in this fast-growing field. Topics to be covered include the following: scanning near field optical microscopy, confocal optical microscopy, atomic force microscopy, magnetic force microscopy, scanning turning microscopy, high-resolution scanning electron microscopy, orientational imaging microscopy, high-resolution transmission electron microscopy, scanning transmission electron microscopy, environmental transmission electron microscopy, quantitative electron diffraction, Lorentz microscopy, electron holography, 3-D transmission electron microscopy, high-spatial resolution quantitative microanalysis, electron-energy-loss spectroscopy and spectral imaging, focused ion beam, secondary ion microscopy, and field ion microscopy.

Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force microscopy; atomic and molecular imaging in liquids; and other new technologies. These results and technologies are now helping evolve NC-AFM toward practical tools for characterization and manipulation of individual atoms/molecules and nanostructures with atomic/subatomic resolution. Therefore, the book exemplifies how NC-AFM has become a crucial tool for the expanding fields of nanoscience and nanotechnology.